| dc.contributor.author | Diakonikolas, Ilias | |
| dc.contributor.author | Servedio, Rocco A. | |
| dc.contributor.author | Valiant, Gregory | |
| dc.contributor.author | Valiant, Paul | |
| dc.contributor.author | Daskalakis, Konstantinos | |
| dc.date.accessioned | 2015-11-20T17:19:02Z | |
| dc.date.available | 2015-11-20T17:19:02Z | |
| dc.date.issued | 2013 | |
| dc.date.submitted | 2012-10 | |
| dc.identifier.isbn | 978-1-61197-251-1 | |
| dc.identifier.isbn | 978-1-61197-310-5 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/99958 | |
| dc.description.abstract | We give highly efficient algorithms, and almost matching lower bounds, for a range of basic statistical problems that involve testing and estimating the L[subscript 1] (total variation) distance between two k-modal distributions p and q over the discrete domain {1, …, n}. More precisely, we consider the following four problems: given sample access to an unknown k-modal distribution p,
Testing identity to a known or unknown distribution:
1. Determine whether p = q (for an explicitly given k-modal distribution q) versus p is e-far from q;
2. Determine whether p = q (where q is available via sample access) versus p is ε-far from q;
Estimating L[subscript 1] distance (“tolerant testing”) against a known or unknown distribution:
3. Approximate d[subscript TV](p, q) to within additive ε where q is an explicitly given k-modal distribution q;
4. Approximate d[subscript TV] (p, q) to within additive ε where q is available via sample access.
For each of these four problems we give sub-logarithmic sample algorithms, and show that our algorithms have optimal sample complexity up to additive poly (k) and multiplicative polylog log n + polylogk factors. Our algorithms significantly improve the previous results of [BKR04], which were for testing identity of distributions (items (1) and (2) above) in the special cases k = 0 (monotone distributions) and k = 1 (unimodal distributions) and required O((log n)[superscript 3]) samples.
As our main conceptual contribution, we introduce a new reduction-based approach for distribution-testing problems that lets us obtain all the above results in a unified way. Roughly speaking, this approach enables us to transform various distribution testing problems for k-modal distributions over {1, …, n} to the corresponding distribution testing problems for unrestricted distributions over a much smaller domain {1, …, ℓ} where ℓ = O(k log n). | en_US |
| dc.description.sponsorship | National Science Foundation (U.S.) (CAREER Award CCF-0953960) | en_US |
| dc.description.sponsorship | Alfred P. Sloan Foundation (Fellowship) | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Society for Industrial and Applied Mathematics | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1137/1.9781611973105.131 | en_US |
| dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
| dc.source | arXiv | en_US |
| dc.title | Testing k-Modal Distributions: Optimal Algorithms via Reductions | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Daskalakis, Constantinos, Ilias Diakonikolas, Rocco A. Servedio, Gregory Valiant, and Paul Valiant. “Testing k -Modal Distributions: Optimal Algorithms via Reductions.” Proceedings of the Twenty-Fourth Annual ACM-SIAM Symposium on Discrete Algorithms (January 6, 2013): 1833–1852. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.mitauthor | Daskalakis, Konstantinos | en_US |
| dc.relation.journal | Proceedings of the Twenty-fourth Annual ACM-SIAM Symposium on Discrete Algorithms | en_US |
| dc.eprint.version | Original manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dspace.orderedauthors | Daskalakis, Constantinos; Diakonikolas, Ilias; Servedio, Rocco A.; Valiant, Gregory; Valiant, Paul | en_US |
| dc.identifier.orcid | https://orcid.org/0000-0002-5451-0490 | |
| mit.license | OPEN_ACCESS_POLICY | en_US |
| mit.metadata.status | Complete | |