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dc.contributor.authorDiakonikolas, Ilias
dc.contributor.authorServedio, Rocco A.
dc.contributor.authorValiant, Gregory
dc.contributor.authorValiant, Paul
dc.contributor.authorDaskalakis, Konstantinos
dc.date.accessioned2015-11-20T17:19:02Z
dc.date.available2015-11-20T17:19:02Z
dc.date.issued2013
dc.date.submitted2012-10
dc.identifier.isbn978-1-61197-251-1
dc.identifier.isbn978-1-61197-310-5
dc.identifier.urihttp://hdl.handle.net/1721.1/99958
dc.description.abstractWe give highly efficient algorithms, and almost matching lower bounds, for a range of basic statistical problems that involve testing and estimating the L[subscript 1] (total variation) distance between two k-modal distributions p and q over the discrete domain {1, …, n}. More precisely, we consider the following four problems: given sample access to an unknown k-modal distribution p, Testing identity to a known or unknown distribution: 1. Determine whether p = q (for an explicitly given k-modal distribution q) versus p is e-far from q; 2. Determine whether p = q (where q is available via sample access) versus p is ε-far from q; Estimating L[subscript 1] distance (“tolerant testing”) against a known or unknown distribution: 3. Approximate d[subscript TV](p, q) to within additive ε where q is an explicitly given k-modal distribution q; 4. Approximate d[subscript TV] (p, q) to within additive ε where q is available via sample access. For each of these four problems we give sub-logarithmic sample algorithms, and show that our algorithms have optimal sample complexity up to additive poly (k) and multiplicative polylog log n + polylogk factors. Our algorithms significantly improve the previous results of [BKR04], which were for testing identity of distributions (items (1) and (2) above) in the special cases k = 0 (monotone distributions) and k = 1 (unimodal distributions) and required O((log n)[superscript 3]) samples. As our main conceptual contribution, we introduce a new reduction-based approach for distribution-testing problems that lets us obtain all the above results in a unified way. Roughly speaking, this approach enables us to transform various distribution testing problems for k-modal distributions over {1, …, n} to the corresponding distribution testing problems for unrestricted distributions over a much smaller domain {1, …, ℓ} where ℓ = O(k log n).en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (CAREER Award CCF-0953960)en_US
dc.description.sponsorshipAlfred P. Sloan Foundation (Fellowship)en_US
dc.language.isoen_US
dc.publisherSociety for Industrial and Applied Mathematicsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1137/1.9781611973105.131en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleTesting k-Modal Distributions: Optimal Algorithms via Reductionsen_US
dc.typeArticleen_US
dc.identifier.citationDaskalakis, Constantinos, Ilias Diakonikolas, Rocco A. Servedio, Gregory Valiant, and Paul Valiant. “Testing k -Modal Distributions: Optimal Algorithms via Reductions.” Proceedings of the Twenty-Fourth Annual ACM-SIAM Symposium on Discrete Algorithms (January 6, 2013): 1833–1852.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorDaskalakis, Konstantinosen_US
dc.relation.journalProceedings of the Twenty-fourth Annual ACM-SIAM Symposium on Discrete Algorithmsen_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsDaskalakis, Constantinos; Diakonikolas, Ilias; Servedio, Rocco A.; Valiant, Gregory; Valiant, Paulen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-5451-0490
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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