System size and energy dependence of near-side dihadron correlations

Agakishiev, G.; Aggarwal, M.; Ahammed, Z.; Alakhverdyants, A.; Alekseev, I.; Alford, J.; Anderson, B.; Anson, C. D.; Arkhipkin, D.; Averichev, G.; Balewski, J.; Barnby, L.; Beavis, D.; Bellwied, R.; Betancourt, M.; Betts, R.; Bhasin, A.; Bhati, A.; Bichsel, H.; Bielcik, J.; Bielcikova, J.; Bland, L.; Bombara, M.; Bordyuzhin, I.; Borowski, W.; Bouchet, J.; Braidot, E.; Brandin, A.; Brovko, S.; Bruna, E.; Bueltmann, S.; Bunzarov, I.; Burton, T.; Cai, X.; Caines, H.; Calderón de la Barca Sánchez, M.; Cebra, D.; Cendejas, R.; Cervantes, M.; Chaloupka, P.; Chattopadhyay, S.; Chen, H.; Chen, J.; Chen, J.; Chen, L.; Cheng, J.; Cherney, M.; Chikanian, A.; Christie, W.; Chung, P.; Codrington, M. J.; Corliss, R.; Cramer, J.; Crawford, H.; Cui, X.; Davila Leyva, A.; De Silva, L.; Debbe, R.; Dedovich, T.; Deng, J.; Derevschikov, A.; Derradi de Souza, R.; Dhamija, S.; Didenko, L.; Djawotho, P.; Dong, X.; Drachenberg, J.; Draper, J.; Du, C.; Dunkelberger, L.; Dunlop, J.; Efimov, L.; Elnimr, M.; Engelage, J.; Eppley, G.; Eun, L.; Evdokimov, O.; Fatemi, R.; Fedorisin, J.; Fersch, R.; Filip, P.; Finch, E.; Fisyak, Y.; Gagliardi, C.; Gaillard, L.; Gangadharan, D.; Geurts, F.; Ghosh, P.; Gliske, S.; Gorbunov, Y.; Grebenyuk, O.; Grosnick, D.; Gupta, A.; Gupta, S.; Guryn, W.; Haag, B.; Hajkova, O.; Hamed, A.; Han, L.-X.; Harris, J.; Hays-Wehle, J.; Heppelmann, S.; Hirsch, A.; Hoffmann, G.; Hofman, D.; Horvat, S.; Huang, B.; Huang, H.; Humanic, T.; Huo, L.; Igo, G.; Jacobs, W.; Jena, C.; Jones, P.; Joseph, J.; Judd, E.; Kabana, S.; Kang, K.; Kapitan, J.; Kauder, K.; Ke, H.; Keane, D.; Kechechyan, A.; Kettler, D.; Kikola, D.; Kiryluk, J.; Kisiel, A.; Kizka, V.; Klein, S.; Koetke, D.; Kollegger, T.; Konzer, J.; Koralt, I.; Koroleva, L.; Korsch, W.; Kotchenda, L.; Kravtsov, P.; Krueger, K.; Kumar, L.; Lamont, M. A.; Landgraf, J.; LaPointe, S.; Lauret, J.; Lebedev, A.; Lednicky, R.; Lee, J.; Leight, W.; LeVine, M.; Li, C.; Li, L.; Li, W.; Li, X.; Li, X.; Li, Y.; Li, Z.; Lima, L.; Lisa, M.; Liu, F.; Ljubicic, T.; Llope, W.; Longacre, R.; Lu, Y.; Lukashov, E.; Luo, X.; Ma, G.; Ma, Y.; Mahapatra, D.; Majka, R.; Mall, O.; Margetis, S.; Markert, C.; Masui, H.; Matis, H.; McDonald, D.; McShane, T.; Minaev, N.; Mioduszewski, S.; Mitrovski, M.; Mohammed, Y.; Mohanty, B.; Mondal, M.; Morozov, B.; Morozov, D.; Munhoz, M.; Mustafa, M.; Naglis, M.; Nandi, B.; Nattrass, C.; Nasim, Md.; Nayak, T.; Nogach, L.; Nurushev, S.; Odyniec, G.; Ogawa, A.; Oh, K.; Ohlson, A.; Okorokov, V.; Oldag, E.; Oliveira, R. A.; Olson, D.; Pachr, M.; Page, B.; Pal, S.; Pan, S.; Pandit, Y.; Panebratsev, Y.; Pawlak, T.; Pei, H.; Perkins, C.; Peryt, W.; Pile, P.; Planinic, M.; Pluta, J.; Plyku, D.; Poljak, N.; Porter, J.; Poskanzer, A.; Powell, C.; Prindle, D.; Pruneau, C.; Pruthi, N.; Pujahari, P.; Putschke, J.; Qiu, H.; Raniwala, R.; Raniwala, S.; Ray, R.; Redwine, R.; Reed, R.; Riley, C.; Ritter, H.; Roberts, J.; Rogachevskiy, O.; Romero, J.; Ruan, L.; Rusnak, J.; Sahoo, N.; Sakrejda, I.; Salur, S.; Sandweiss, J.; Sangaline, E.; Sarkar, A.; Schambach, J.; Scharenberg, R.; Schmah, A.; Schmitz, N.; Schuster, T.; Seele, J.; Seger, J.; Seyboth, P.; Shah, N.; Shahaliev, E.; Shao, M.; Sharma, B.; Sharma, M.; Shi, S.; Shou, Q.; Sichtermann, E.; Singaraju, R.; Skoby, M.; Smirnov, N.; Solanki, D.; Sorensen, P.; deSouza, U.; Spinka, H.; Srivastava, B.; Stanislaus, T. D.; Steadman, S.; Stevens, J.; Stock, R.; Strikhanov, M.; Stringfellow, B.; Suaide, A. A.; Suarez, M.; Sumbera, M.; Sun, X.; Sun, Y.; Sun, Z.; Surrow, B.; Svirida, D.; Symons, T. J.; Szanto de Toledo, A.; Takahashi, J.; Tang, A.; Tang, Z.; Tarini, L.; Tarnowsky, T.; Thein, D.; Thomas, J.; Tian, J.; Timmins, A.; Tlusty, D.; Tokarev, M.; Trentalange, S.; Tribble, R.; Tribedy, P.; Trzeciak, B.; Tsai, O.; Ullrich, T.; Underwood, D.; Van Buren, G.; van Nieuwenhuizen, G.; Vanfossen, J.; Varma, R.; Vasconcelos, G. M.; Vasiliev, A.; Videbæk, F.; Viyogi, Y.; Vokal, S.; Voloshin, S.; Vossen, A.; Wada, M.; Wang, G.; Wang, H.; Wang, J.; Wang, Q.; Wang, X.; Wang, Y.; Webb, G.; Webb, J.; Westfall, G.; Whitten, C.; Wieman, H.; Wissink, S.; Witt, R.; Witzke, W.; Wu, Y.; Xiao, Z.; Xie, W.; Xu, H.; Xu, N.; Xu, Q.; Xu, W.; Xu, Y.; Xu, Z.; Xue, L.; Yang, Y.; Yang, Y.; Yepes, P.; Yi, Y.; Yip, K.; Yoo, I.-K.; Zawisza, M.; Zbroszczyk, H.; Zhan, W.; Zhang, J.; Zhang, S.; Zhang, W.; Zhang, X.; Zhang, Y.; Zhang, Z.; Zhao, F.; Zhao, J.; Zhong, C.; Zhu, X.; Zhu, Y.; Zoulkarneeva, Y.

Author(s)

Balewski, Jan T.; Betancourt, Michael Joseph; Corliss, Ross Cameron; Hays-Wehle, James Prewitt; Leight, William Axel; ... Show more

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Abstract

rticle azimuthal (Δφ) and pseudorapidity (Δη) correlations using a trigger particle with large transverse momentum (pT) in d+Au, Cu+Cu, and Au+Au collisions at √sNN = 62.4 GeV and 200 GeV from the STAR experiment at the Relativistic Heavy Ion Collider are presented. The near-side correlation is separated into a jet-like component, narrow in both Δφ and Δη, and the ridge, narrow in Δφ but broad in Δη. Both components are studied as a function of collision centrality, and the jet-like correlation is studied as a function of the trigger and associated pT. The behavior of the jet-like component is remarkably consistent for different collision systems, suggesting it is produced by fragmentation. The width of the jet-like correlation is found to increase with the system size. The ridge, previously observed in Au+Au collisions at √sNN = 200 GeV, is also found in Cu+Cu collisions and in collisions at √sNN = 62.4 GeV, but is found to be substantially smaller at √sNN = 62.4 GeV than at √sNN = 200 GeV for the same average number of participants (⟨Npart⟩). Measurements of the ridge are compared to models.

Date issued

2012-01

URI

http://hdl.handle.net/1721.1/72138

Department

Massachusetts Institute of Technology. Department of Physics; Massachusetts Institute of Technology. Laboratory for Nuclear Science; Massachusetts Institute of Technology. School of Science

Journal

Physical Review C

Publisher

American Physical Society

Citation

Version: Final published version

ISSN

0556-2813

1089-490X

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