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A 32-mu W 1.83-kS/s Carbon Nanotube Chemical Sensor System

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Title: A 32-mu W 1.83-kS/s Carbon Nanotube Chemical Sensor System
Author: Cho, Taeg Sang; Lee, Kyeong-Jae; Kong, Jing; Chandrakasan, Anantha P.
Department: Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science; Massachusetts Institute of Technology. Microsystems Technology Laboratories
Publisher: Institute of Electrical and Electronics Engineers
Issue Date: 2009-01
Abstract: This paper presents an energy-efficient chemical sensor system that uses carbon nanotubes (CNT) as the sensing medium. The room-temperature operation of CNT sensors eliminates the need for micro hot-plate arrays, which enables the low energy operation of the system. An array of redundant CNT sensors overcomes the reliability issues incurred by the CNT process variation. The sensor interface chip is designed to accommodate a 16-bit dynamic range by adaptively controlling an 8-bit DAC and a 10-bit ADC. A discrete optimization methodology determines the dynamic range of the DAC and the ADC to minimize the energy consumption of the system. A simple calibration technique using off-chip reference resistors reduces the DAC non-linearity. The sensor interface chip is designed in a 0.18-mum CMOS process and consumes, at maximum, 32 muW at 1.83 kS/s conversion rate. The designed interface achieves 1.34% measurement accuracy across the 10 kOmega-9 MOmega range. The functionality of the full system, including CNT sensors, has been successfully demonstrated.
URI: http://hdl.handle.net/1721.1/52699
Other Identifiers: INSPEC Accession Number: 10459100
ISSN: 0018-9200
Citation: Taeg Sang Cho et al. “A 32- \mu W 1.83-kS/s Carbon Nanotube Chemical Sensor System.” Solid-State Circuits, IEEE Journal of 44.2 (2009): 659-669. © 2009 Institute of Electrical and Electronics Engineers
Version: Final published version
Terms of Use: Article is made available in accordance with the publisher’s policy and may be subject to US copyright law. Please refer to the publisher’s site for terms of use.
Published as: http://dx.doi.org/10.1109/jssc.2008.2010805
Journal: IEEE Journal of Solid-State Circuits

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