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dc.contributor.authorAlbo, Asaf
dc.contributor.authorHu, Qing
dc.date.accessioned2015-12-16T22:23:19Z
dc.date.available2015-12-16T22:23:19Z
dc.date.issued2015-04
dc.date.submitted2015-03
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.urihttp://hdl.handle.net/1721.1/100398
dc.description.abstractIn this paper, we demonstrate a method to investigate the temperature degradation of THz quantum cascade lasers (QCLs) based on analyzing the dependence of lasing output power on temperature. The output power is suggested to decrease exponentially with some characteristic activation energy indicative of the degradation mechanism. As a proof of concept, Arrhenius plots of power versus temperature are used to extract the activation energy in vertical transition THz QCLs. The extracted energies are consistent with thermally activated longitudinal optical-phonon scattering being the dominant degradation mechanism, as is generally accepted. The extracted activation energy values are shown to be in good agreement with the values predicted from laser spectra.en_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.description.sponsorshipIsrael. Ministry of Defenseen_US
dc.description.sponsorshipMIT-Technion Fellowshipen_US
dc.description.sponsorshipAndrew and Erna Finci Viterbi Fellowshipen_US
dc.language.isoen_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.4916961en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleInvestigating temperature degradation in THz quantum cascade lasers by examination of temperature dependence of output poweren_US
dc.typeArticleen_US
dc.identifier.citationAlbo, Asaf, and Qing Hu. “Investigating Temperature Degradation in THz Quantum Cascade Lasers by Examination of Temperature Dependence of Output Power.” Applied Physics Letters 106, no. 13 (March 30, 2015): 131108. © 2015 AIP Publishing LLCen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorAlbo, Asafen_US
dc.contributor.mitauthorHu, Qingen_US
dc.relation.journalApplied Physics Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsAlbo, Asaf; Hu, Qingen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-1982-4053
dc.identifier.orcidhttps://orcid.org/0000-0002-7073-2958
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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