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dc.contributor.authorTownsend, Alex John
dc.date.accessioned2015-12-29T01:57:03Z
dc.date.available2015-12-29T01:57:03Z
dc.date.issued2015-08
dc.date.submitted2015-05
dc.identifier.issn0036-1429
dc.identifier.issn1095-7170
dc.identifier.urihttp://hdl.handle.net/1721.1/100550
dc.description.abstractA fast and numerically stable algorithm is described for computing the discrete Hankel transform of order 0 as well as evaluating Schlömilch and Fourier--Bessel expansions in O(N(log N)[superscript 2]/loglog N) operations. The algorithm is based on an asymptotic expansion for Bessel functions of large arguments, the fast Fourier transform, and the Neumann addition formula. All the algorithmic parameters are selected from error bounds to achieve a near-optimal computational cost for any accuracy goal. Numerical results demonstrate the efficiency of the resulting algorithm.en_US
dc.language.isoen_US
dc.publisherSociety for Industrial and Applied Mathematicsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1137/151003106en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSociety for Industrial and Applied Mathematicsen_US
dc.titleA Fast Analysis-Based Discrete Hankel Transform Using Asymptotic Expansionsen_US
dc.typeArticleen_US
dc.identifier.citationTownsend, Alex. “A Fast Analysis-Based Discrete Hankel Transform Using Asymptotic Expansions.” SIAM J. Numer. Anal. 53, no. 4 (January 2015): 1897–1917. © 2015, Society for Industrial and Applied Mathematicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mathematicsen_US
dc.contributor.mitauthorTownsend, Alex Johnen_US
dc.relation.journalSIAM Journal on Numerical Analysisen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsTownsend, Alexen_US
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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