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High throughput optical lithography by scanning a massive array of bowtie aperture antennas at near-field

Author(s)
Wen, X.; Datta, A.; Traverso, L. M.; Pan, L.; Xu, X.; Moon, Euclid Eberle; ... Show more Show less
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Abstract
Optical lithography, the enabling process for defining features, has been widely used in semiconductor industry and many other nanotechnology applications. Advances of nanotechnology require developments of high-throughput optical lithography capabilities to overcome the optical diffraction limit and meet the ever-decreasing device dimensions. We report our recent experimental advancements to scale up diffraction unlimited optical lithography in a massive scale using the near field nanolithography capabilities of bowtie apertures. A record number of near-field optical elements, an array of 1,024 bowtie antenna apertures, are simultaneously employed to generate a large number of patterns by carefully controlling their working distances over the entire array using an optical gap metrology system. Our experimental results reiterated the ability of using massively-parallel near-field devices to achieve high-throughput optical nanolithography, which can be promising for many important nanotechnology applications such as computation, data storage, communication, and energy.
Date issued
2015-11
URI
http://hdl.handle.net/1721.1/100905
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Journal
Scientific Reports
Publisher
Nature Publishing Group
Citation
Wen, X., A. Datta, L. M. Traverso, L. Pan, X. Xu, and E. E. Moon. “High Throughput Optical Lithography by Scanning a Massive Array of Bowtie Aperture Antennas at Near-Field.” Scientific Reports 5 (November 3, 2015): 16192.
Version: Final published version
ISSN
2045-2322

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