| dc.contributor.author | Wen, X. | |
| dc.contributor.author | Datta, A. | |
| dc.contributor.author | Traverso, L. M. | |
| dc.contributor.author | Pan, L. | |
| dc.contributor.author | Xu, X. | |
| dc.contributor.author | Moon, Euclid Eberle | |
| dc.date.accessioned | 2016-01-18T23:01:20Z | |
| dc.date.available | 2016-01-18T23:01:20Z | |
| dc.date.issued | 2015-11 | |
| dc.date.submitted | 2015-04 | |
| dc.identifier.issn | 2045-2322 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/100905 | |
| dc.description.abstract | Optical lithography, the enabling process for defining features, has been widely used in semiconductor industry and many other nanotechnology applications. Advances of nanotechnology require developments of high-throughput optical lithography capabilities to overcome the optical diffraction limit and meet the ever-decreasing device dimensions. We report our recent experimental advancements to scale up diffraction unlimited optical lithography in a massive scale using the near field nanolithography capabilities of bowtie apertures. A record number of near-field optical elements, an array of 1,024 bowtie antenna apertures, are simultaneously employed to generate a large number of patterns by carefully controlling their working distances over the entire array using an optical gap metrology system. Our experimental results reiterated the ability of using massively-parallel near-field devices to achieve high-throughput optical nanolithography, which can be promising for many important nanotechnology applications such as computation, data storage, communication, and energy. | en_US |
| dc.description.sponsorship | United States. Defense Advanced Research Projects Agency (Grant N66001-08-1-2037) | en_US |
| dc.description.sponsorship | National Science Foundation (U.S.) (Grant CMMI-1120577) | en_US |
| dc.description.sponsorship | National Science Foundation (U.S.) (Grant CMMI-1405078) | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Nature Publishing Group | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1038/srep16192 | en_US |
| dc.rights | Creative Commons Attribution | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | en_US |
| dc.source | Nature Publishing Group | en_US |
| dc.title | High throughput optical lithography by scanning a massive array of bowtie aperture antennas at near-field | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Wen, X., A. Datta, L. M. Traverso, L. Pan, X. Xu, and E. E. Moon. “High Throughput Optical Lithography by Scanning a Massive Array of Bowtie Aperture Antennas at Near-Field.” Scientific Reports 5 (November 3, 2015): 16192. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.mitauthor | Moon, Euclid Eberle | en_US |
| dc.relation.journal | Scientific Reports | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Wen, X.; Datta, A.; Traverso, L. M.; Pan, L.; Xu, X.; Moon, E. E. | en_US |
| mit.license | OPEN_ACCESS_POLICY | en_US |