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dc.contributor.authorRaghunathan, Rajamani
dc.contributor.authorJohlin, Eric Carl
dc.contributor.authorGrossman, Jeffrey C.
dc.date.accessioned2016-03-30T17:36:28Z
dc.date.available2016-03-30T17:36:28Z
dc.date.issued2014-06
dc.date.submitted2014-06
dc.identifier.issn1530-6984
dc.identifier.issn1530-6992
dc.identifier.urihttp://hdl.handle.net/1721.1/101939
dc.description.abstractIn photovoltaic devices, the bulk disorder introduced by grain boundaries (GBs) in polycrystalline silicon is generally considered to be detrimental to the physical stability and electronic transport of the bulk material. However, at the extremum of disorder, amorphous silicon is known to have a beneficially increased band gap and enhanced optical absorption. This study is focused on understanding and utilizing the nature of the most commonly encountered Σ[subscript 3] GBs, in an attempt to balance incorporation of the advantageous properties of amorphous silicon while avoiding the degraded electronic transport of a fully amorphous system. A combination of theoretical methods is employed to understand the impact of ordered Σ[subscript 3] GBs on the material properties and full-device photovoltaic performance.en_US
dc.description.sponsorshipKing Fahd University of Petroleum and Minerals (Project R1-CE-08)en_US
dc.language.isoen_US
dc.publisherAmerican Chemical Society (ACS)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1021/nl501020qen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleGrain Boundary Engineering for Improved Thin Silicon Photovoltaicsen_US
dc.typeArticleen_US
dc.identifier.citationRaghunathan, Rajamani, Eric Johlin, and Jeffrey C. Grossman. “Grain Boundary Engineering for Improved Thin Silicon Photovoltaics.” Nano Lett. 14, no. 9 (September 10, 2014): 4943–4950.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorRaghunathan, Rajamanien_US
dc.contributor.mitauthorJohlin, Eric Carlen_US
dc.contributor.mitauthorGrossman, Jeffrey C.en_US
dc.relation.journalNano Lettersen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsRaghunathan, Rajamani; Johlin, Eric; Grossman, Jeffrey C.en_US
dc.identifier.orcidhttps://orcid.org/0000-0003-1281-2359
dspace.mitauthor.errortrue
mit.licensePUBLISHER_POLICYen_US


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