dc.contributor.author | Boo, Hyun Ho | |
dc.contributor.author | Boning, Duane S. | |
dc.contributor.author | Lee, Hae-Seung | |
dc.date.accessioned | 2016-06-08T20:05:00Z | |
dc.date.available | 2016-06-08T20:05:00Z | |
dc.date.issued | 2015-12 | |
dc.date.submitted | 2015-06 | |
dc.identifier.issn | 0018-9200 | |
dc.identifier.issn | 1558-173X | |
dc.identifier.other | INSPEC Accession Number: 15618350 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/103067 | |
dc.description.abstract | The virtual ground reference buffer (VGRB) technique is introduced as a means to improve the performance of switched-capacitor circuits. The technique enhances the performance by improving the feedback factor of the op-amp without affecting the signal gain. The bootstrapping action of the level-shifting buffers relaxes key op-amp performance requirements including unity-gain bandwidth, noise, open-loop gain and offset compared with conventional circuits. This reduces the design complexity and the power consumption of op-amp based circuits. Based on this technique, a 12 b pipelined ADC is implemented in 65 nm CMOS that achieves 67.0 dB SNDR at 250 MS/s and consumes 49.7 mW of power from a 1.2 V power supply. | en_US |
dc.language.iso | en_US | |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1109/JSSC.2015.2467183 | en_US |
dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
dc.source | Prof. Duane Boning | en_US |
dc.title | A 12b 250 MS/s Pipelined ADC With Virtual Ground Reference Buffers | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Boo, Hyun H., Duane S. Boning, and Hae-Seung Lee. "A 12b 250 MS/s Pipelined ADC With Virtual Ground Reference Buffers." IEEE Journal of Solid-State Circuits 50:12 (2015), p.2912-2921. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
dc.contributor.approver | Boning, Duane S. | en_US |
dc.contributor.mitauthor | Boo, Hyun Ho | en_US |
dc.contributor.mitauthor | Boning, Duane S. | en_US |
dc.contributor.mitauthor | Lee, Hae-Seung | en_US |
dc.relation.journal | IEEE Journal of Solid-State Circuits | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Boo, Hyun H.; Boning, Duane S.; Lee, Hae-Seung | en_US |
dspace.embargo.terms | N | en_US |
dc.identifier.orcid | https://orcid.org/0000-0002-7783-0403 | |
dc.identifier.orcid | https://orcid.org/0000-0002-0417-445X | |
mit.license | OPEN_ACCESS_POLICY | en_US |