Show simple item record

dc.contributor.authorNiroui, Farnaz
dc.contributor.authorSletten, Ellen M.
dc.contributor.authorDeotare, Parag Bhaskar
dc.contributor.authorWang, Annie I
dc.contributor.authorSwager, Timothy M
dc.contributor.authorLang, Jeffrey H
dc.contributor.authorBulovic, Vladimir
dc.date.accessioned2017-05-02T14:52:27Z
dc.date.available2017-05-02T14:52:27Z
dc.date.issued2015-01
dc.identifier.isbn978-1-4799-7955-4
dc.identifier.issn1084-6999
dc.identifier.otherINSPEC Accession Number: 14949382
dc.identifier.urihttp://hdl.handle.net/1721.1/108573
dc.description.abstractUtilizing stiction, a common failure mode in micro/nano electromechanical systems (M/NEMS), we propose a method for the controlled fabrication of nanometer-thin gaps between electrodes. In this approach, a single lithography step is used to pattern cantilevers that undergo lateral motion towards opposing stationary electrodes separated by a defined gap. Upon wet developing of the pattern, capillary forces induce cantilever deflection and collapse leading to permanent adhesion between the tip and an opposing support structure. The deflection consequently reduces the separation gap between the cantilever and the electrodes neighboring the point of stiction to dimensions smaller than originally patterned. Through nanoscale force control achieved by altering device design, we demonstrate the fabrication of nanogaps having controlled widths smaller than 15 nm. We further discuss optimization of these nanoscale gaps for applications in NEM and molecular devices.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Center for Energy Efficient Electronics Science (E3S) Award ECCS-0939514)en_US
dc.description.sponsorshipNatural Sciences and Engineering Research Council of Canadaen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/MEMSYS.2015.7050892en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceProf. Lang via Phoebe Ayersen_US
dc.titleControlled fabrication of nanoscale gaps using stictionen_US
dc.typeArticleen_US
dc.identifier.citationNiroui, Farnaz, Ellen M. Sletten, Parag B. Deotare, Annie I. Wang, Timothy M. Swager, Jeffrey H. Lang, and Vladimir Bulovic. “Controlled Fabrication of Nanoscale Gaps Using Stiction.” 2015 28th IEEE International Conference on Micro Electro Mechanical Systems (MEMS) (January 18-22, 2015), Estoril, Portugal.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.approverLang, Jeffrey Hen_US
dc.contributor.mitauthorNiroui, Farnaz
dc.contributor.mitauthorSletten, Ellen M.
dc.contributor.mitauthorDeotare, Parag Bhaskar
dc.contributor.mitauthorWang, Annie I
dc.contributor.mitauthorSwager, Timothy M
dc.contributor.mitauthorLang, Jeffrey H
dc.contributor.mitauthorBulovic, Vladimir
dc.relation.journal2015 28th IEEE International Conference on Micro Electro Mechanical Systems (MEMS)en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsNiroui, Farnaz; Sletten, Ellen M.; Deotare, Parag B.; Wang, Annie I.; Swager, Timothy M.; Lang, Jeffrey H.; Bulovic, Vladimiren_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-2332-2657
dc.identifier.orcidhttps://orcid.org/0000-0002-9867-7380
dc.identifier.orcidhttps://orcid.org/0000-0003-0349-9460
dc.identifier.orcidhttps://orcid.org/0000-0002-5765-4369
dc.identifier.orcidhttps://orcid.org/0000-0002-0960-2580
mit.licenseOPEN_ACCESS_POLICYen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record