| dc.contributor.author | Huang, Mantao | |
| dc.contributor.author | Tan, Aik Jun | |
| dc.contributor.author | Mann, Maxwell | |
| dc.contributor.author | Bauer, Uwe | |
| dc.contributor.author | Ouedraogo, Raoul O. | |
| dc.contributor.author | Beach, Geoffrey Stephen | |
| dc.date.accessioned | 2017-09-29T18:33:04Z | |
| dc.date.available | 2017-09-29T18:33:04Z | |
| dc.date.issued | 2017-08 | |
| dc.date.submitted | 2017-04 | |
| dc.identifier.issn | 2045-2322 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/111657 | |
| dc.description.abstract | A solid-state three-terminal resistive switch based on gate-voltage-tunable reversible oxidation of a thin-film metallic channel is demonstrated. The switch is composed of a cobalt wire placed under a GdOx layer and a Au top electrode. The lateral resistance of the wire changes with the transition between cobalt and cobalt oxide controlled by a voltage applied to the top electrode. The kinetics of the oxidation and reduction process are examined through time- and temperature-dependent transport measurements. It is shown that that reversible voltage induced lateral resistance switching with a ratio of 10 3 can be achieved at room temperature. The reversible non-volatile redox reaction between metal and metal oxide may provide additional degrees of freedom for post-fabrication control of properties of solid-state materials. This type of three-terminal device has potential applications in neuromorphic computing and multilevel data storage, as well as applications that require controlling a relatively large current. | en_US |
| dc.description.sponsorship | National Science Foundation (U.S.) (Grant DMR-1419807) | en_US |
| dc.publisher | Nature Publishing Group | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1038/s41598-017-06954-x | en_US |
| dc.rights | Creative Commons Attribution 4.0 International License | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | en_US |
| dc.source | Nature | en_US |
| dc.title | Three-terminal resistive switch based on metal/metal oxide redox reactions | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Huang, Mantao, et al. “Three-Terminal Resistive Switch Based on Metal/metal Oxide Redox Reactions.” Scientific Reports 7, 1 (August 2017): 7452 © 2017 The Author(s) | en_US |
| dc.contributor.department | Lincoln Laboratory | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
| dc.contributor.mitauthor | Huang, Mantao | |
| dc.contributor.mitauthor | Tan, Aik Jun | |
| dc.contributor.mitauthor | Mann, Maxwell | |
| dc.contributor.mitauthor | Bauer, Uwe | |
| dc.contributor.mitauthor | Ouedraogo, Raoul O. | |
| dc.contributor.mitauthor | Beach, Geoffrey Stephen | |
| dc.relation.journal | Scientific Reports | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dc.date.updated | 2017-09-29T12:18:21Z | |
| dspace.orderedauthors | Huang, Mantao; Tan, Aik Jun; Mann, Maxwell; Bauer, Uwe; Ouedraogo, Raoul; Beach, Geoffrey S. D. | en_US |
| dspace.embargo.terms | N | en_US |
| dc.identifier.orcid | https://orcid.org/0000-0002-2076-5321 | |
| dc.identifier.orcid | https://orcid.org/0000-0002-6858-8424 | |
| dc.identifier.orcid | https://orcid.org/0000-0002-8719-2652 | |
| dc.identifier.orcid | https://orcid.org/0000-0002-9998-7276 | |
| mit.license | PUBLISHER_CC | en_US |