dc.contributor.author | Arutt, Charles N | |
dc.contributor.author | Alles, Michael L | |
dc.contributor.author | Liao, Wenjun | |
dc.contributor.author | Gong, Huiqi | |
dc.contributor.author | Davidson, Jim L | |
dc.contributor.author | Schrimpf, Ronald D | |
dc.contributor.author | Reed, Robert A | |
dc.contributor.author | Weller, Robert A | |
dc.contributor.author | Bolotin, Kirill | |
dc.contributor.author | Nicholl, Ryan | |
dc.contributor.author | Pham, Thang Toan | |
dc.contributor.author | Zettl, Alex | |
dc.contributor.author | Li, Mo | |
dc.contributor.author | Alphenaar, Bruce W | |
dc.contributor.author | Lin, Ji-Tzuoh | |
dc.contributor.author | Shurva, Pranoy Deb | |
dc.contributor.author | McNamara, Shamus | |
dc.contributor.author | Walsh, Kevin M | |
dc.contributor.author | Feng, Philip X-L | |
dc.contributor.author | Hutin, Louis | |
dc.contributor.author | Ernst, Thomas | |
dc.contributor.author | Homeijer, Brian D | |
dc.contributor.author | Polcawich, Ronald G | |
dc.contributor.author | Proie, Robert M | |
dc.contributor.author | Jones, Jacob L | |
dc.contributor.author | Glaser, Evan R | |
dc.contributor.author | Cress, Cory D | |
dc.contributor.author | Bassiri-Gharb, Nazanin | |
dc.contributor.author | Du, Qingyang | |
dc.contributor.author | Hu, Juejun | |
dc.date.accessioned | 2017-12-08T14:52:06Z | |
dc.date.available | 2017-12-08T14:52:06Z | |
dc.date.issued | 2016-12 | |
dc.date.submitted | 2016-10 | |
dc.identifier.issn | 0268-1242 | |
dc.identifier.issn | 1361-6641 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/112648 | |
dc.description.abstract | The potential of micro and nano electromechanical systems (M and NEMS) has expanded due to advances in materials and fabrication processes. A wide variety of materials are now being pursued and deployed for M and NEMS including silicon carbide (SiC), III–V materials, thin-film piezoelectric and ferroelectric, electro-optical and 2D atomic crystals such as graphene, hexagonal boron nitride (h-BN), and molybdenum disulfide (MoS₂). The miniaturization, functionality and low-power operation offered by these types of devices are attractive for many application areas including physical sciences, medical, space and military uses, where exposure to radiation is a reliability consideration. Understanding the impact of radiation on these materials and devices is necessary for applications in radiation environments. | en_US |
dc.description.sponsorship | Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0027) | en_US |
dc.description.sponsorship | Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0035) | en_US |
dc.description.sponsorship | Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0036) | en_US |
dc.description.sponsorship | Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0039) | en_US |
dc.description.sponsorship | Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0060) | en_US |
dc.language.iso | en_US | |
dc.publisher | IOP Publishing | en_US |
dc.relation.isversionof | https://doi.org/10.1088/1361-6641/32/1/013005 | en_US |
dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
dc.source | Prof. Hu via Erja Kajosalo | en_US |
dc.title | The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs) | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Arutt, Charles N et al. “The Study of Radiation Effects in Emerging Micro and Nano Electro Mechanical Systems (M and NEMs).” Semiconductor Science and Technology 32, 1 (December 2016): 013005 © 2016 IOP Publishing Ltd | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
dc.contributor.approver | Hu, Juejun | en_US |
dc.contributor.mitauthor | Du, Qingyang | |
dc.contributor.mitauthor | Hu, Juejun | |
dc.relation.journal | Semiconductor Science and Technology | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Arutt, Charles N; Alles, Michael L; Liao, Wenjun; Gong, Huiqi; Davidson, Jim L; Schrimpf, Ronald D; Reed, Robert A; Weller, Robert A; Bolotin, Kirill; Nicholl, Ryan; Pham, Thang Toan; Zettl, Alex; Qingyang, Du; Hu, Juejun; Li, Mo; Alphenaar, Bruce W; Lin, Ji-Tzuoh; Shurva, Pranoy Deb; McNamara, Shamus; Walsh, Kevin M; Feng, Philip X-L; Hutin, Louis; Ernst, Thomas; Homeijer, Brian D; Polcawich, Ronald G; Proie, Robert M; Jones, Jacob L; Glaser, Evan R; Cress, Cory D; Bassiri-Gharb, Nazanin | en_US |
dspace.embargo.terms | N | en_US |
dc.identifier.orcid | https://orcid.org/0000-0002-1424-356X | |
dc.identifier.orcid | https://orcid.org/0000-0002-7233-3918 | |
mit.license | OPEN_ACCESS_POLICY | en_US |