| dc.contributor.author | von Hippel, Eric A. | |
| dc.date.accessioned | 2017-12-29T15:59:34Z | |
| dc.date.available | 2017-12-29T15:59:34Z | |
| dc.date.issued | 2013-09 | |
| dc.identifier.issn | 1532-9194 | |
| dc.identifier.issn | 1532-8937 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/112967 | |
| dc.description.abstract | When business executives and economists think about whether developing an innovation will be worthwhile, they tend to focus on the economic value of the outcome of the innovation process. “Will we earn enough profit from using or selling X innovation to justify the money and time required to develop it?” is, in effect, the question they ask. | en_US |
| dc.language.iso | en_US | |
| dc.publisher | MIT Press | en_US |
| dc.relation.isversionof | http://sloanreview.mit.edu/article/innovation-process-benefits-the-journey-as-reward/ | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | Prof. von Hippel via Shikha Sharma | en_US |
| dc.title | Innovation Process Benefits: The Journey as Reward | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Raasch, Christina and Eric von Hippel. "Innovation Process Benefits: The Journey as Reward." MIT Sloan Management Review, September 2013, pp. 33-39. | en_US |
| dc.contributor.department | Sloan School of Management | en_US |
| dc.contributor.mitauthor | von Hippel, Eric A. | |
| dc.relation.journal | MIT Sloan Management Review | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Raasch, Christina; Von Himmel, Eric A. | en_US |
| dspace.embargo.terms | N | en_US |
| dc.identifier.orcid | https://orcid.org/0000-0002-7235-1032 | |
| dspace.mitauthor.error | true | |
| mit.license | PUBLISHER_POLICY | en_US |
