Quasi-ballistic thermal transport from nanoscale interfaces observed using ultrafast coherent soft x-ray beams
Author(s)Siemens, Mark E.; Li, Qing; Yang, Ronggui; Anderson, Erik H.; Murnane, Margaret M.; Kapteyn, Henry C.; Nelson, Keith Adam; ... Show more Show less
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Heat dissipation from a nanoscale hot-spot is expected to be non-diffusive when a hot-spot is smaller than the phonon mean free path of the substrate. Our technique of observing diffraction of coherent soft x-ray pulses allows for very high resolution (∼pm) of thermally-induced surface distortion, as well as femtosecond time resolution of dynamics. We successfully model our experimental results with a diffusive transport model that is modified to include an additional boundary resistance. These results confirm the importance of considering ballistic transport away from a nanoscale heat source, and identify a means of correctly accounting for this ballistic transport.
DepartmentMassachusetts Institute of Technology. Department of Chemistry
Proceedings of SPIE--the Society of Photo-Optical Instrumentation Engineers
Siemens, Mark E. et al “Quasi-Ballistic Thermal Transport from Nanoscale Interfaces Observed Using Ultrafast Coherent Soft x-Ray Beams.” Edited by Kong-Thon Tsen, Jin-Joo Song, Markus Betz, and Abdulhakem Y. Elezzabi. Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV 7937 (February 2011): 793716 © 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE)
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