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dc.contributor.authorApichitsopa, Nicha
dc.contributor.authorJaffe, Alexander S.
dc.contributor.authorVoldman, Joel
dc.date.accessioned2018-07-11T15:35:49Z
dc.date.available2018-07-11T15:35:49Z
dc.date.issued2018-04
dc.date.submitted2018-03
dc.identifier.issn1473-0197
dc.identifier.issn1473-0189
dc.identifier.urihttp://hdl.handle.net/1721.1/116896
dc.description.abstractAn abundance of label-free microfluidic techniques for measuring cell intrinsic markers exists, yet these techniques are seldom combined because of integration complexity such as restricted physical space and incompatible modes of operation. We introduce a multiparameter intrinsic cytometry approach for the characterization of single cells that combines ≥2 label-free measurement techniques onto the same platform and uses cell tracking to associate the measured properties to cells. Our proof-of-concept implementation can measure up to five intrinsic properties including size, deformability, and polarizability at three frequencies. Each measurement module along with the integrated platform were validated and evaluated in the context of chemically induced changes in the actin cytoskeleton of cells. viSNE and machine learning classification were used to determine the orthogonality between and the contribution of the measured intrinsic markers for cell classification.en_US
dc.publisherRoyal Society of Chemistry (RSC)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1039/c8lc00240aen_US
dc.rightsCreative Commons Attribution-NonCommercial 3.0 Unporteden_US
dc.rights.urihttps://creativecommons.org/licenses/by-nc/3.0/en_US
dc.sourceRoyal Society of Chemistryen_US
dc.titleMultiparameter cell-tracking intrinsic cytometry for single-cell characterizationen_US
dc.typeArticleen_US
dc.identifier.citationApichitsopa, N., A. Jaffe, and J. Voldman. “Multiparameter Cell-Tracking Intrinsic Cytometry for Single-Cell Characterization.” Lab on a Chip 18, 10 (2018): 1430–1439 © 2018 Royal Society of Chemistryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorApichitsopa, Nicha
dc.contributor.mitauthorJaffe, Alexander S.
dc.contributor.mitauthorVoldman, Joel
dc.relation.journalLab on a Chipen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2018-07-11T15:19:05Z
dspace.orderedauthorsApichitsopa, N.; Jaffe, A.; Voldman, J.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-7705-4467
dc.identifier.orcidhttps://orcid.org/0000-0001-8358-8898
dc.identifier.orcidhttps://orcid.org/0000-0001-8898-2296
mit.licensePUBLISHER_CCen_US


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