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dc.contributor.authorLee, G. H.
dc.contributor.authorHuang, K.-F.
dc.contributor.authorShain, K.
dc.contributor.authorLee, S.-P.
dc.contributor.authorWard, J.
dc.contributor.authorKim, P.
dc.contributor.authorHalperin, B. I.
dc.contributor.authorYacoby, A.
dc.contributor.authorNandi, Debaleena
dc.contributor.authorSkinner, Barbara
dc.contributor.authorChang, Cui-zu
dc.contributor.authorOu, Yunbo
dc.contributor.authorMoodera, Jagadeesh
dc.date.accessioned2019-01-08T16:31:25Z
dc.date.available2019-01-08T16:31:25Z
dc.date.issued2018-12
dc.date.submitted2018-08
dc.identifier.issn2469-9950
dc.identifier.issn2469-9969
dc.identifier.urihttp://hdl.handle.net/1721.1/119872
dc.description.abstractIn an ultrathin topological insulator (TI) film, a hybridization gap opens in the TI surface states, and the system is expected to become either a trivial insulator or a quantum spin Hall insulator when the chemical potential is within the hybridization gap. Here we show, however, that these insulating states are destroyed by the presence of a large and long-range-correlated disorder potential, which converts the expected insulator into a metal. We perform transport measurements in ultrathin dual-gated topological insulator films as a function of temperature, gate voltage, and magnetic field, and we observe a metalliclike nonquantized conductivity, which exhibits a weak antilocalizationlike cusp at low magnetic fields and gives way to a nonsaturating linear magnetoresistance at large fields. We explain these results by considering the disordered network of electron- and hole-type puddles induced by charged impurities. We argue theoretically that such disorder can produce an insulator-to-metal transition as a function of increasing disorder strength, and we derive a condition on the band gap and the impurity concentration necessary to observe the insulating state. We also explain the linear magnetoresistance in terms of strong spatial fluctuations of the local conductivity using both numerical simulations and a theoretical scaling argument.en_US
dc.description.sponsorshipGordon and Betty Moore Foundation (Grant GBMF4531)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant DMR-1708688)en_US
dc.description.sponsorshipUnited States. Army Research Office (Grant W911NF16-1-0491)en_US
dc.description.sponsorshipUnited States. Army Research Office (Grant W911NF-17-1-0023)en_US
dc.description.sponsorshipUnited States. Army Research Office (Grant W911NF-18-1-0316)en_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.98.214203en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Physical Societyen_US
dc.titleSignatures of long-range-correlated disorder in the magnetotransport of ultrathin topological insulatorsen_US
dc.typeArticleen_US
dc.identifier.citationNandi, D. et al. "Signatures of long-range-correlated disorder in the magnetotransport of ultrathin topological insulators." Physical Review B 98, 21 (December 2018): 214203 © 2018 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Plasma Science and Fusion Centeren_US
dc.contributor.departmentFrancis Bitter Magnet Laboratory (Massachusetts Institute of Technology)en_US
dc.contributor.mitauthorNandi, Debaleena
dc.contributor.mitauthorSkinner, Barbara
dc.contributor.mitauthorChang, Cui-zu
dc.contributor.mitauthorOu, Yunbo
dc.contributor.mitauthorMoodera, Jagadeesh
dc.relation.journalPhysical Review Ben_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2018-12-19T18:00:17Z
dc.language.rfc3066en
dc.rights.holderAmerican Physical Society
dspace.orderedauthorsNandi, D.; Skinner, B.; Lee, G. H.; Huang, K.-F.; Shain, K.; Chang, Cui-Zu; Ou, Y.; Lee, S.-P.; Ward, J.; Moodera, J. S.; Kim, P.; Halperin, B. I.; Yacoby, A.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-7413-5715
dc.identifier.orcidhttps://orcid.org/0000-0002-9350-8756
dc.identifier.orcidhttps://orcid.org/0000-0002-2480-1211
mit.licensePUBLISHER_POLICYen_US


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