Pushing phase and amplitude sensitivity limits in interferometric microscopy
Author(s)Diaspro, Alberto; Hosseini, Poorya; Zhou, Renjie; Kim, Yang-Hyo; Peres, Chiara; Kuang, Cuifang; Yaqoob, Zahid; So, Peter T. C.; ... Show more Show less
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Sensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting factor in interferometric microscopy measurements. Thereafter,wedemonstratehowa state-of-the-art camera with million-level electrons full well capacity can significantly reduce shot noise contribution resulting in a stability of optical path length down to a few picometers even in a near-common-path interferometer.
DepartmentMassachusetts Institute of Technology. Biological Engineering Accelerator Mass Spectrometry Laboratory; Massachusetts Institute of Technology. Department of Biological Engineering; Massachusetts Institute of Technology. Department of Chemistry; Massachusetts Institute of Technology. Department of Mechanical Engineering
The Optical Society
Hosseini, Poorya, Renjie Zhou, Yang-Hyo Kim, Chiara Peres, Alberto Diaspro, Cuifang Kuang, Zahid Yaqoob, and Peter T. C. So. “Pushing Phase and Amplitude Sensitivity Limits in Interferometric Microscopy.” Optics Letters 41, no. 7 (April 1, 2016): 1656.
Author's final manuscript