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dc.contributor.authorDiaspro, Alberto
dc.contributor.authorHosseini, Poorya
dc.contributor.authorZhou, Renjie
dc.contributor.authorKim, Yang-Hyo
dc.contributor.authorPeres, Chiara
dc.contributor.authorKuang, Cuifang
dc.contributor.authorYaqoob, Zahid
dc.contributor.authorSo, Peter T. C.
dc.date.accessioned2019-02-11T19:03:08Z
dc.date.available2019-02-11T19:03:08Z
dc.date.issued2016-04
dc.identifier.issn0146-9592
dc.identifier.issn1539-4794
dc.identifier.urihttp://hdl.handle.net/1721.1/120330
dc.description.abstractSensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting factor in interferometric microscopy measurements. Thereafter,wedemonstratehowa state-of-the-art camera with million-level electrons full well capacity can significantly reduce shot noise contribution resulting in a stability of optical path length down to a few picometers even in a near-common-path interferometer.en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (1R01EY017656-06)en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (1U01NS090438-01)en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (9P41EB015871-28)en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (DP3DK101024-01)en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (1-R01HL121386-01)en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (1R21NS091982-01)en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (1U01CA202177-01)en_US
dc.description.sponsorshipHamamatsu Corporationen_US
dc.description.sponsorshipSingapore-MIT Allianceen_US
dc.description.sponsorshipSkolkovo Foundationen_US
dc.description.sponsorshipKoch Institute for Integrative Cancer Research. Bridge Project Initiativeen_US
dc.description.sponsorshipConnecticut Children's Medical Centeren_US
dc.description.sponsorshipSamsung Advanced Institute of Technologyen_US
dc.publisherThe Optical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1364/OL.41.001656en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcePMCen_US
dc.titlePushing phase and amplitude sensitivity limits in interferometric microscopyen_US
dc.typeArticleen_US
dc.identifier.citationHosseini, Poorya, Renjie Zhou, Yang-Hyo Kim, Chiara Peres, Alberto Diaspro, Cuifang Kuang, Zahid Yaqoob, and Peter T. C. So. “Pushing Phase and Amplitude Sensitivity Limits in Interferometric Microscopy.” Optics Letters 41, no. 7 (April 1, 2016): 1656.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Biological Engineering Accelerator Mass Spectrometry Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Biological Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorHosseini, Poorya
dc.contributor.mitauthorZhou, Renjie
dc.contributor.mitauthorKim, Yang-Hyo
dc.contributor.mitauthorPeres, Chiara
dc.contributor.mitauthorKuang, Cuifang
dc.contributor.mitauthorYaqoob, Zahid
dc.contributor.mitauthorSo, Peter T. C.
dc.relation.journalOptics Lettersen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2019-01-03T19:07:24Z
dspace.orderedauthorsHosseini, Poorya; Zhou, Renjie; Kim, Yang-Hyo; Peres, Chiara; Diaspro, Alberto; Kuang, Cuifang; Yaqoob, Zahid; So, Peter T. C.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-7347-7887
dc.identifier.orcidhttps://orcid.org/0000-0002-4761-6641
dc.identifier.orcidhttps://orcid.org/0000-0001-5183-576X
dc.identifier.orcidhttps://orcid.org/0000-0003-4698-6488
mit.licenseOPEN_ACCESS_POLICYen_US


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