Self-referenced quantitative phase microscopy

Author(s)
Hillman, Timothy Robert; Lue, Niyom; Sung, Yongjin; Dasari, Ramachandra Rao; So, Peter T. C.; ... Show more
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Abstract
Self-referenced quantitative phase microscopy (SrQPM) is reported, wherein quantitative phase imaging is achieved through the interference of the sample wave with a reflected version of itself. The off-axis interference between the two beams generates a spatially modulated hologram that is analyzed to quantify the sample's amplitude and phase profile. SrQPM requires approximately one-half of the object field of view to be empty and optically flat, which serves as a reference for the other half of the field of view containing the sample.
Date issued
2012-02
URI
http://hdl.handle.net/1721.1/120341
Department
Lincoln Laboratory; Massachusetts Institute of Technology. Department of Biological Engineering; Massachusetts Institute of Technology. Department of Chemistry; Massachusetts Institute of Technology. Department of Mechanical Engineering; Massachusetts Institute of Technology. Spectroscopy Laboratory
Publisher
SPIE-Intl Soc Optical Eng
Citation
Hillman, Timothy R., Niyom Lue, Yongjin Sung, Ramachandra R. Dasari, Peter T. C. So, and Zahid Yaqoob. “Self-Referenced Quantitative Phase Microscopy.” Edited by Jose-Angel Conchello, Carol J. Cogswell, Tony Wilson, and Thomas G. Brown. Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX (February 9, 2012).
Version: Final published version
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