| dc.contributor.author | Hillman, Timothy Robert | |
| dc.contributor.author | Lue, Niyom | |
| dc.contributor.author | Sung, Yongjin | |
| dc.contributor.author | Dasari, Ramachandra Rao | |
| dc.contributor.author | So, Peter T. C. | |
| dc.contributor.author | Yaqoob, Zahid | |
| dc.date.accessioned | 2019-02-12T16:16:13Z | |
| dc.date.available | 2019-02-12T16:16:13Z | |
| dc.date.issued | 2012-02 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/120341 | |
| dc.description.abstract | Self-referenced quantitative phase microscopy (SrQPM) is reported, wherein quantitative phase imaging is achieved through the interference of the sample wave with a reflected version of itself. The off-axis interference between the two beams generates a spatially modulated hologram that is analyzed to quantify the sample's amplitude and phase profile. SrQPM requires approximately one-half of the object field of view to be empty and optically flat, which serves as a reference for the other half of the field of view containing the sample. | en_US |
| dc.publisher | SPIE-Intl Soc Optical Eng | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1117/12.909701 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | SPIE | en_US |
| dc.title | Self-referenced quantitative phase microscopy | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Hillman, Timothy R., Niyom Lue, Yongjin Sung, Ramachandra R. Dasari, Peter T. C. So, and Zahid Yaqoob. “Self-Referenced Quantitative Phase Microscopy.” Edited by Jose-Angel Conchello, Carol J. Cogswell, Tony Wilson, and Thomas G. Brown. Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX (February 9, 2012). | en_US |
| dc.contributor.department | Lincoln Laboratory | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Biological Engineering | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Chemistry | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Spectroscopy Laboratory | en_US |
| dc.contributor.mitauthor | Hillman, Timothy Robert | |
| dc.contributor.mitauthor | Lue, Niyom | |
| dc.contributor.mitauthor | Sung, Yongjin | |
| dc.contributor.mitauthor | Dasari, Ramachandra Rao | |
| dc.contributor.mitauthor | So, Peter T. C. | |
| dc.contributor.mitauthor | Yaqoob, Zahid | |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dc.date.updated | 2019-01-03T18:08:00Z | |
| dspace.orderedauthors | Hillman, Timothy R.; Lue, Niyom; Sung, Yongjin; Dasari, Ramachandra R.; So, Peter T. C.; Yaqoob, Zahid | en_US |
| dspace.embargo.terms | N | en_US |
| dc.identifier.orcid | https://orcid.org/0000-0002-1170-6493 | |
| dc.identifier.orcid | https://orcid.org/0000-0003-4698-6488 | |
| mit.license | PUBLISHER_POLICY | en_US |
