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dc.contributor.authorCharaev, Ilya
dc.contributor.authorDane, Andrew
dc.contributor.authorAgarwal, Akshay
dc.contributor.authorBerggren, Karl K.
dc.date.accessioned2020-04-13T13:15:34Z
dc.date.available2020-04-13T13:15:34Z
dc.date.issued2019-02
dc.identifier.issn1051-8223
dc.identifier.issn1558-2515
dc.identifier.issn2378-7074
dc.identifier.urihttps://hdl.handle.net/1721.1/124559
dc.description.abstractThe method of negative-tone polymethyl methacrylate (PMMA) electron-beam lithography is investigated to improve the performance of nanowire-based superconducting detectors. Using this approach, the superconducting nanowire single-photon detectors (SNSPDs) have been fabricated from 5-nm-thick NbN film sputtered at room temperature. To investigate the impact of this process, SNSPDs were prepared by positive-tone- and negative-tone-PMMA lithography, and their electrical and photodetection characteristics at 4.2 K were compared. The SNSPDs made by negative-tone-PMMA lithography show higher critical-current density and higher photon count rate at various wavelengths. Our results suggest a higher negative-tone-PMMA technology may be preferable to the standard positive-tone-PMMA lithography for this application. Keywords: Films; Nanowires; Lithography; Temperature measurement; Detectors; Current measurement; Niobium compoundsen_US
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/tasc.2019.2898677en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleEnhancement of Optical Response in Nanowires by Negative-Tone PMMA Lithographyen_US
dc.typeArticleen_US
dc.identifier.citationCharaev, Ilya et al "Enhancement of Optical Response in Nanowires by Negative-Tone PMMA Lithography." IEEE Transactions on Applied Superconductivity 29, 5 (August 2019): 1100905 ©2019 IEEE.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.relation.journalIEEE Transactions on Applied Superconductivityen_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2019-05-08T17:38:46Z
dspace.date.submission2019-05-08T17:38:46Z
mit.journal.volume29en_US
mit.journal.issue5en_US
mit.metadata.statusComplete


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