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dc.contributor.authorTang, Jennifer Susan
dc.contributor.authorWang, Da
dc.contributor.authorPolyanskiy, Yury
dc.contributor.authorWornell, Gregory
dc.date.accessioned2020-05-01T19:26:05Z
dc.date.available2020-05-01T19:26:05Z
dc.date.issued2018-07
dc.identifier.issn1557-9654
dc.identifier.issn0018-9448
dc.identifier.urihttps://hdl.handle.net/1721.1/124983
dc.description.abstractThis paper addresses the problem of adding redundancy to a collection of physical objects so that the overall system is more robust to failures. In contrast to its information counterpart, which can exploit parity to protect multiple information symbols from a single erasure, physical redundancy can only be realized through duplication and substitution of objects. We propose a bipartite graph model for designing defect-tolerant systems, in which the defective objects are replaced by the judiciously connected redundant objects. The fundamental limits of this model are characterized under various asymptotic settings and both asymptotic and finite-size systems that approach these limits are constructed. Among other results, we show that the simple modular redundancy is in general suboptimal. As we develop, this combinatorial problem of defect tolerant system design has a natural interpretation as one of graph coloring, and the analysis is significantly different from that traditionally used in information redundancy for error-control codes.©2018en_US
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionof10.1109/TIT.2017.2771417en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceMIT web domainen_US
dc.titleDefect tolerance: fundamental limits and examplesen_US
dc.typeArticleen_US
dc.identifier.citationTang, Jennifer Susan, Da Wang, Yury Polyanskiy, and Gregory Wornell, "Defect tolerance: fundamental limits and examples." IEEE Transactions on Information Theory 64, 7 (July 2018): p. 5240-60 doi 10.1109/TIT.2017.2771417 ©2018 Author(s)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.relation.journalIEEE Transactions on Information Theoryen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2019-07-01T17:51:37Z
dspace.date.submission2019-07-01T17:51:38Z
mit.journal.volume64en_US
mit.journal.issue7en_US
mit.metadata.statusComplete


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