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dc.contributor.authorSu, P.
dc.contributor.authorPujari, R.
dc.contributor.authorBoodhoo, V.
dc.contributor.authorAggarwal, S.
dc.contributor.authorBhattacharya, P.
dc.contributor.authorMaksimov, O.
dc.contributor.authorWada, Kazumi
dc.contributor.authorMerlo, S.
dc.contributor.authorBhandari, H. B.
dc.contributor.authorKimerling, Lionel C
dc.contributor.authorAgarwal, Abhinandan
dc.date.accessioned2021-04-06T19:55:25Z
dc.date.available2021-04-06T19:55:25Z
dc.date.issued2020-04
dc.date.submitted2019-12
dc.identifier.issn0361-5235
dc.identifier.issn1543-186X
dc.identifier.urihttps://hdl.handle.net/1721.1/130396
dc.description.abstractWe demonstrate thin films of PbSe1−xSx and PbSe1−xTex lead chalcogenide ternary alloys as infrared detectors. The films were deposited on single crystal BaF2 substrates using physical vapor deposition. Detectivity in the wavelength range from 1 μm to 5 μm was measured at −40°C, and all films showed photoresponse signals more than an order of magnitude larger than their noise. The detectivity spectra were used to assess the tunability of the band gap from mixing the lead chalcogenide binaries. The PbSe1−xSx system showed tunability that followed Vegard’s law, while the PbSe1−xTex system showed tunability with a bowing parameter of −0.096 eV. Comparisons to measurements from the literature taken at room temperature suggest that the bowing parameter decreases with decreasing temperature, and the band gap temperature coefficient with respect to composition also shows bowing.en_US
dc.description.sponsorshipONR (Award N68335- 19-C-0070)en_US
dc.publisherSpringer Science and Business Media LLCen_US
dc.relation.isversionofhttps://doi.org/10.1007/s11664-020-08114-wen_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceSpringer USen_US
dc.titleTernary Lead Chalcogenide Alloys for Mid-Infrared Detectorsen_US
dc.typeArticleen_US
dc.identifier.citationSu, P. et al. "Ternary Lead Chalcogenide Alloys for Mid-Infrared Detectors." Journal of Electronic Materials 49, 8 (April 2020): 4577–4580 © 2020 The Minerals, Metals & Materials Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMIT Materials Research Laboratoryen_US
dc.relation.journalJournal of Electronic Materialsen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2020-09-24T21:41:33Z
dc.language.rfc3066en
dc.rights.holderThe Minerals, Metals & Materials Society
dspace.embargo.termsY
dspace.date.submission2020-09-24T21:41:33Z
mit.journal.volume49en_US
mit.journal.issue8en_US
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusComplete


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