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dc.contributor.authorCampbell, Trevor
dc.contributor.authorHuggins, Jonathan H
dc.contributor.authorHow, Jonathan P
dc.contributor.authorBroderick, Tamara
dc.date.accessioned2021-10-27T20:05:31Z
dc.date.available2021-10-27T20:05:31Z
dc.date.issued2019
dc.identifier.urihttps://hdl.handle.net/1721.1/134549
dc.description.abstract© 2019 ISI/BS. Completely random measures (CRMs) and their normalizations are a rich source of Bayesian nonparametric priors. Examples include the beta, gamma, and Dirichlet processes. In this paper, we detail two major classes of sequential CRM representations—series representations and superposition representations—within which we organize both novel and existing sequential representations that can be used for simulation and posterior inference. These two classes and their constituent representations subsume existing ones that have previously been developed in an ad hoc manner for specific processes. Since a complete infinite-dimensional CRM cannot be used explicitly for computation, sequential representations are often truncated for tractability. We provide truncation error analyses for each type of sequential representation, as well as their normalized versions, thereby generalizing and improving upon existing truncation error bounds in the literature. We analyze the computational complexity of the sequential representations, which in conjunction with our error bounds allows us to directly compare representations and discuss their relative efficiency. We include numerous applications of our theoretical results to commonly-used (normalized) CRMs, demonstrating that our results enable a straightforward representation and analysis of CRMs that has not previously been available in a Bayesian nonparametric context.
dc.language.isoen
dc.publisherBernoulli Society for Mathematical Statistics and Probability
dc.relation.isversionof10.3150/18-BEJ1020
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/
dc.sourcearXiv
dc.titleTruncated random measures
dc.typeArticle
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Information and Decision Systems
dc.relation.journalBernoulli
dc.eprint.versionAuthor's final manuscript
dc.type.urihttp://purl.org/eprint/type/JournalArticle
eprint.statushttp://purl.org/eprint/status/PeerReviewed
dc.date.updated2019-10-28T17:28:40Z
dspace.orderedauthorsCampbell, T; Huggins, JH; How, JP; Broderick, T
dspace.date.submission2019-10-28T17:28:44Z
mit.journal.volume25
mit.journal.issue2
mit.metadata.statusAuthority Work and Publication Information Needed


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