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Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC
| dc.contributor.author | Aniceto, Raichelle | |
| dc.contributor.author | Moro, Slaven | |
| dc.contributor.author | Milanowski, Randall | |
| dc.contributor.author | Isabelle, Christopher | |
| dc.contributor.author | Hall, Norman | |
| dc.contributor.author | Vermeire, Bert | |
| dc.contributor.author | Cahoy, Kerri | |
| dc.date.accessioned | 2021-11-09T17:39:46Z | |
| dc.date.available | 2021-11-09T17:39:46Z | |
| dc.date.issued | 2017-07 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/137994 | |
| dc.description.abstract | © 2017 IEEE. Experimental assessment of commercial 100/200 Gbps optical coherent DSP modem ASIC completed with 64 MeV and 480 MeV proton radiation test campaigns. Single event effect cross sections calculated and no performance degradation observed for proton fluence levels up to 1.27×1012 p/cm2 with equivalent total ionizing dose exposure to 170 krad(Si). | en_US |
| dc.language.iso | en | |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
| dc.relation.isversionof | 10.1109/nsrec.2017.8115466 | en_US |
| dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
| dc.source | Prof. Cahoy via Barbara Williams | en_US |
| dc.title | Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Aniceto, Raichelle, Moro, Slaven, Milanowski, Randall, Isabelle, Christopher, Hall, Norman et al. 2017. "Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC." | |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dc.date.updated | 2019-07-29T18:27:07Z | |
| dspace.date.submission | 2019-07-29T18:27:12Z | |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |
