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dc.contributor.authorJiang, Bo
dc.contributor.authorMeng, Kai
dc.contributor.authorYoucef-Toumi, Kamal
dc.date.accessioned2022-02-01T16:56:13Z
dc.date.available2022-01-27T13:36:27Z
dc.date.available2022-02-01T16:56:13Z
dc.date.issued2021-08
dc.date.submitted2021-07
dc.identifier.issn1094-4087
dc.identifier.urihttps://hdl.handle.net/1721.1/139762.2
dc.description.abstractEllipsometry is an important metrology tool in a plethora of industries. The measurement accuracy can be significantly affected by the existence of Poisson-Gaussian mixed noise. This paper quantifies the induced error on normalized Mueller matrix measurements through statistical analysis. A method is then proposed to mitigate the effects of Poisson-Gaussian noise in spectroscopic ellipsometry signal demodulation, based on maximum likelihood estimation. The noise is characterized through experiments on an in-house setup. The improved performance of dimension reconstruction from the proposed method is demonstrated through simulations.en_US
dc.language.isoen
dc.publisherOptical Society of Americaen_US
dc.relation.isversionofhttp://dx.doi.org/10.1364/OE.432793en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceOSA Publishingen_US
dc.titleQuantification and reduction of Poisson-Gaussian mixed noise induced errors in ellipsometryen_US
dc.typeArticleen_US
dc.identifier.citationJiang, Bo, Meng, Kai and Youcef-Toumi, Kamal. 2021. "Quantification and reduction of Poisson-Gaussian mixed noise induced errors in ellipsometry." Optics Express, 29 (17).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.relation.journalOptics Expressen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2022-01-27T13:31:27Z
dspace.orderedauthorsJiang, B; Meng, K; Youcef-Toumi, Ken_US
dspace.date.submission2022-01-27T13:31:29Z
mit.journal.volume29en_US
mit.journal.issue17en_US
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work Neededen_US


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