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Toward Controlling Filament Size and Location for Resistive Switches via Nanoparticle Exsolution at Oxide Interfaces

Author(s)
Spring, Jonathan; Sediva, Eva; Hood, Zachary D.; Gonzalez‐Rosillo, Juan Carlos; O'Leary, Willis; Kim, Kun Joong; Carrillo, Alfonso J.; Rupp, Jennifer L. M.; ... Show more Show less
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.

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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Metadata
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Date issued
2020-09-17
URI
https://hdl.handle.net/1721.1/140640
Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering; Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Journal
Small
Publisher
Wiley
Citation
Spring, Jonathan, Sediva, Eva, Hood, Zachary D., Gonzalez‐Rosillo, Juan Carlos, O'Leary, Willis et al. 2020. "Toward Controlling Filament Size and Location for Resistive Switches via Nanoparticle Exsolution at Oxide Interfaces." Small, 16 (41).
Version: Author's final manuscript
ISSN
1613-6810
1613-6829

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