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dc.contributor.authorSpring, Jonathan
dc.contributor.authorSediva, Eva
dc.contributor.authorHood, Zachary D.
dc.contributor.authorGonzalez‐Rosillo, Juan Carlos
dc.contributor.authorO'Leary, Willis
dc.contributor.authorKim, Kun Joong
dc.contributor.authorCarrillo, Alfonso J.
dc.contributor.authorRupp, Jennifer L. M.
dc.date.accessioned2022-02-23T18:07:39Z
dc.date.available2022-02-23T18:07:39Z
dc.date.issued2020-09-17
dc.identifier.issn1613-6810
dc.identifier.issn1613-6829
dc.identifier.urihttps://hdl.handle.net/1721.1/140640
dc.languageen
dc.publisherWileyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1002/smll.202003224en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceWileyen_US
dc.titleToward Controlling Filament Size and Location for Resistive Switches via Nanoparticle Exsolution at Oxide Interfacesen_US
dc.typeArticleen_US
dc.identifier.citationSpring, Jonathan, Sediva, Eva, Hood, Zachary D., Gonzalez‐Rosillo, Juan Carlos, O'Leary, Willis et al. 2020. "Toward Controlling Filament Size and Location for Resistive Switches via Nanoparticle Exsolution at Oxide Interfaces." Small, 16 (41).
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.relation.journalSmallen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.date.submission2022-02-09T20:55:10Z
mit.journal.volume16en_US
mit.journal.issue41en_US
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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