Silica: ubiquitous poison of metal oxide interfaces

Author(s)
Staerz, Anna; Seo, Han Gil; Defferriere, Thomas; Tuller, Harry L
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Creative Commons Attribution NonCommercial License 3.0 https://creativecommons.org/licenses/by-nc/3.0/
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Abstract
In this review, we consider the detrimental effects of Si-contamination on electrochemical applications, broadly conceived, in which both ions and electrons play key roles in device operation and where exchange of oxygen between the gas and solid phase is likewise essential for operation.
Date issued
2022-02-08
URI
https://hdl.handle.net/1721.1/141037
Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Journal
Journal of Materials Chemistry A
Publisher
Royal Society of Chemistry (RSC)
Citation
Staerz, Anna, Seo, Han Gil, Defferriere, Thomas and Tuller, Harry L. 2022. "Silica: ubiquitous poison of metal oxide interfaces." Journal of Materials Chemistry A, 10 (6).
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