Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors
Author(s)
Turchetti, Marco; Bionta, Mina R; Yang, Yujia; Ritzkowsky, Felix; Candido, Denis R; Flatté, Michael E; Berggren, Karl K; Keathley, Phillip D; ... Show more Show less
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Show full item recordDate issued
2021Department
Massachusetts Institute of Technology. Research Laboratory of ElectronicsJournal
Journal of the Optical Society of America B: Optical Physics
Publisher
The Optical Society
Citation
Turchetti, Marco, Bionta, Mina R, Yang, Yujia, Ritzkowsky, Felix, Candido, Denis R et al. 2021. "Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors." Journal of the Optical Society of America B: Optical Physics, 38 (3).
Version: Original manuscript