dc.contributor.author | Turchetti, Marco | |
dc.contributor.author | Bionta, Mina R | |
dc.contributor.author | Yang, Yujia | |
dc.contributor.author | Ritzkowsky, Felix | |
dc.contributor.author | Candido, Denis R | |
dc.contributor.author | Flatté, Michael E | |
dc.contributor.author | Berggren, Karl K | |
dc.contributor.author | Keathley, Phillip D | |
dc.date.accessioned | 2022-05-26T18:07:31Z | |
dc.date.available | 2022-05-26T18:07:31Z | |
dc.date.issued | 2021 | |
dc.identifier.uri | https://hdl.handle.net/1721.1/142778 | |
dc.language.iso | en | |
dc.publisher | The Optical Society | en_US |
dc.relation.isversionof | 10.1364/JOSAB.413680 | en_US |
dc.rights | Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International | en_US |
dc.rights.uri | https://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
dc.source | arXiv | en_US |
dc.title | Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Turchetti, Marco, Bionta, Mina R, Yang, Yujia, Ritzkowsky, Felix, Candido, Denis R et al. 2021. "Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors." Journal of the Optical Society of America B: Optical Physics, 38 (3). | |
dc.contributor.department | Massachusetts Institute of Technology. Research Laboratory of Electronics | |
dc.relation.journal | Journal of the Optical Society of America B: Optical Physics | en_US |
dc.eprint.version | Original manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
dc.date.updated | 2022-05-26T17:59:16Z | |
dspace.orderedauthors | Turchetti, M; Bionta, MR; Yang, Y; Ritzkowsky, F; Candido, DR; Flatté, ME; Berggren, KK; Keathley, PD | en_US |
dspace.date.submission | 2022-05-26T17:59:18Z | |
mit.journal.volume | 38 | en_US |
mit.journal.issue | 3 | en_US |
mit.license | OPEN_ACCESS_POLICY | |
mit.metadata.status | Authority Work and Publication Information Needed | en_US |