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dc.contributor.authorTurchetti, Marco
dc.contributor.authorBionta, Mina R
dc.contributor.authorYang, Yujia
dc.contributor.authorRitzkowsky, Felix
dc.contributor.authorCandido, Denis R
dc.contributor.authorFlatté, Michael E
dc.contributor.authorBerggren, Karl K
dc.contributor.authorKeathley, Phillip D
dc.date.accessioned2022-05-26T18:07:31Z
dc.date.available2022-05-26T18:07:31Z
dc.date.issued2021
dc.identifier.urihttps://hdl.handle.net/1721.1/142778
dc.language.isoen
dc.publisherThe Optical Societyen_US
dc.relation.isversionof10.1364/JOSAB.413680en_US
dc.rightsCreative Commons Attribution-NonCommercial-ShareAlike 4.0 Internationalen_US
dc.rights.urihttps://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleImpact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectorsen_US
dc.typeArticleen_US
dc.identifier.citationTurchetti, Marco, Bionta, Mina R, Yang, Yujia, Ritzkowsky, Felix, Candido, Denis R et al. 2021. "Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors." Journal of the Optical Society of America B: Optical Physics, 38 (3).
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronics
dc.relation.journalJournal of the Optical Society of America B: Optical Physicsen_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2022-05-26T17:59:16Z
dspace.orderedauthorsTurchetti, M; Bionta, MR; Yang, Y; Ritzkowsky, F; Candido, DR; Flatté, ME; Berggren, KK; Keathley, PDen_US
dspace.date.submission2022-05-26T17:59:18Z
mit.journal.volume38en_US
mit.journal.issue3en_US
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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