Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles

Author(s)
Dalirrooyfard, Mina; Vuong, Thuy Duong; Williams, Virginia Vassilevska
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Date issued
2021
URI
https://hdl.handle.net/1721.1/143941
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
Journal
SIAM Journal on Computing
Publisher
Society for Industrial & Applied Mathematics (SIAM)
Citation
Dalirrooyfard, Mina, Vuong, Thuy Duong and Williams, Virginia Vassilevska. 2021. "Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles." SIAM Journal on Computing, 50 (5).
Version: Final published version
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