| dc.contributor.author | Dalirrooyfard, Mina | |
| dc.contributor.author | Vuong, Thuy Duong | |
| dc.contributor.author | Williams, Virginia Vassilevska | |
| dc.date.accessioned | 2022-07-21T16:44:14Z | |
| dc.date.available | 2022-07-21T16:44:14Z | |
| dc.date.issued | 2021 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/143941 | |
| dc.language.iso | en | |
| dc.publisher | Society for Industrial & Applied Mathematics (SIAM) | en_US |
| dc.relation.isversionof | 10.1137/20M1335054 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | SIAM | en_US |
| dc.title | Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Dalirrooyfard, Mina, Vuong, Thuy Duong and Williams, Virginia Vassilevska. 2021. "Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles." SIAM Journal on Computing, 50 (5). | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.contributor.department | Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory | |
| dc.relation.journal | SIAM Journal on Computing | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dc.date.updated | 2022-07-21T16:35:37Z | |
| dspace.orderedauthors | Dalirrooyfard, M; Vuong, TD; Williams, VV | en_US |
| dspace.date.submission | 2022-07-21T16:35:38Z | |
| mit.journal.volume | 50 | en_US |
| mit.journal.issue | 5 | en_US |
| mit.license | PUBLISHER_POLICY | |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |
