Cross-Entropy-Based Importance Sampling with Failure-Informed Dimension Reduction for Rare Event Simulation
Author(s)
Uribe, Felipe; Papaioannou, Iason; Marzouk, Youssef M; Straub, Daniel
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Show full item recordDate issued
2021Department
Massachusetts Institute of Technology. Department of Aeronautics and AstronauticsJournal
SIAM/ASA Journal on Uncertainty Quantification
Publisher
Society for Industrial & Applied Mathematics (SIAM)
Citation
Uribe, Felipe, Papaioannou, Iason, Marzouk, Youssef M and Straub, Daniel. 2021. "Cross-Entropy-Based Importance Sampling with Failure-Informed Dimension Reduction for Rare Event Simulation." SIAM/ASA Journal on Uncertainty Quantification, 9 (2).
Version: Final published version