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dc.contributor.authorUribe, Felipe
dc.contributor.authorPapaioannou, Iason
dc.contributor.authorMarzouk, Youssef M
dc.contributor.authorStraub, Daniel
dc.date.accessioned2022-09-15T15:35:08Z
dc.date.available2022-09-15T15:35:08Z
dc.date.issued2021
dc.identifier.urihttps://hdl.handle.net/1721.1/145427
dc.language.isoen
dc.publisherSociety for Industrial & Applied Mathematics (SIAM)en_US
dc.relation.isversionof10.1137/20M1344585en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSIAMen_US
dc.titleCross-Entropy-Based Importance Sampling with Failure-Informed Dimension Reduction for Rare Event Simulationen_US
dc.typeArticleen_US
dc.identifier.citationUribe, Felipe, Papaioannou, Iason, Marzouk, Youssef M and Straub, Daniel. 2021. "Cross-Entropy-Based Importance Sampling with Failure-Informed Dimension Reduction for Rare Event Simulation." SIAM/ASA Journal on Uncertainty Quantification, 9 (2).
dc.contributor.departmentMassachusetts Institute of Technology. Department of Aeronautics and Astronauticsen_US
dc.relation.journalSIAM/ASA Journal on Uncertainty Quantificationen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2022-09-15T15:30:40Z
dspace.orderedauthorsUribe, F; Papaioannou, I; Marzouk, YM; Straub, Den_US
dspace.date.submission2022-09-15T15:30:41Z
mit.journal.volume9en_US
mit.journal.issue2en_US
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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