| dc.contributor.author | Logan, Julie V | |
| dc.contributor.author | Webster, Preston T | |
| dc.contributor.author | Woller, Kevin B | |
| dc.contributor.author | Morath, Christian P | |
| dc.contributor.author | Short, Michael P | |
| dc.date.accessioned | 2023-01-20T18:54:55Z | |
| dc.date.available | 2023-01-20T18:54:55Z | |
| dc.date.issued | 2022-08-08 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/147619 | |
| dc.language.iso | en | |
| dc.publisher | American Physical Society (APS) | en_US |
| dc.relation.isversionof | 10.1103/physrevmaterials.6.084601 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | APS | en_US |
| dc.title | Understanding the fundamental driver of semiconductor radiation tolerance with experiment and theory | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Logan, Julie V, Webster, Preston T, Woller, Kevin B, Morath, Christian P and Short, Michael P. 2022. "Understanding the fundamental driver of semiconductor radiation tolerance with experiment and theory." Physical Review Materials, 6 (8). | |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Nuclear Science and Engineering | en_US |
| dc.relation.journal | Physical Review Materials | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dc.date.updated | 2023-01-20T18:43:00Z | |
| dspace.orderedauthors | Logan, JV; Webster, PT; Woller, KB; Morath, CP; Short, MP | en_US |
| dspace.date.submission | 2023-01-20T18:43:02Z | |
| mit.journal.volume | 6 | en_US |
| mit.journal.issue | 8 | en_US |
| mit.license | PUBLISHER_POLICY | |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |
