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dc.contributor.authorBarbastathis, George
dc.contributor.authorZhang, Qihang
dc.contributor.authorPandit, Ajinkya
dc.contributor.authorTang, Wenlong
dc.contributor.authorPapageorgiou, Charles
dc.contributor.authorBraatz, Richard
dc.contributor.authorMyerson, Allan S
dc.contributor.authorTan, Bingyao
dc.contributor.authorSchmetterer, Leopold
dc.date.accessioned2024-12-02T21:21:16Z
dc.date.available2024-12-02T21:21:16Z
dc.date.issued2023-08-11
dc.identifier.urihttps://hdl.handle.net/1721.1/157741
dc.descriptionSPIE Optical Metrology, 2023, Munich, Germanyen_US
dc.description.abstractWe discuss the use of machine learning in computational imaging for manufacturing process inspection and control. In a recent article we described a physics-enhanced auto-correlation based estimator (Peace) for quantitative speckle. We derived an explicit forward relationship between the Particle Size Distribution (PSD) and the speckle autocorrelation for particle sizes significantly larger than the wavelength (x100 to approximately x1,000). We subsequently trained a machine learning kernel to invert the autocorrelation and obtain the PSD, using the explicit forward model to reduce the number of experimentally acquired examples. In this talk, we present an expanded discussion of Peace and its properties, including spatial and temporal sampling and accuracy, and more general applications.en_US
dc.language.isoen
dc.publisherSPIEen_US
dc.relation.isversionof10.1117/12.2678259en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSPIEen_US
dc.titleOn the use of physics in machine learning for manufacturing process inspectionen_US
dc.typeArticleen_US
dc.identifier.citationProceedings Volume 12622, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials VI; 126220Y (2023).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemical Engineeringen_US
dc.contributor.departmentSingapore-MIT Alliance in Research and Technology (SMART)en_US
dc.relation.journalOptical Methods for Inspection, Characterization, and Imaging of Biomaterials VIen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2024-12-02T21:13:12Z
dspace.orderedauthorsBarbastathis, G; Zhang, Q; Pandit, A; Tang, W; Papageorgiou, C; Braatz, R; Myerson, AS; Tan, B; Schmetterer, Len_US
dspace.date.submission2024-12-02T21:13:13Z
mit.journal.volume12622en_US
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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