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Quantum Imaging beyond the Diffraction Limit by Optical Centroid Measurements

Author(s)
Tsang, Mankei
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.

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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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Abstract
I propose a quantum imaging method that can beat the Rayleigh-Abbe diffraction limit and achieve de Broglie resolution without requiring a multi-photon absorber or coincidence detection. Using the same non-classical states of light as those for quantum lithography, the proposed method requires only optical intensity measurements, followed by image post-processing, to produce the same complex quantum interference patterns as those in quantum lithography. The method is expected to be experimentally realizable using current technology.
Date issued
2009-06
URI
http://hdl.handle.net/1721.1/49506
Department
Massachusetts Institute of Technology. Research Laboratory of Electronics
Journal
Physical review letters
Publisher
American Physical Society
Citation
Tsang, Mankei. “Quantum Imaging beyond the Diffraction Limit by Optical Centroid Measurements.” Physical Review Letters 102.25 (2009): 253601-4.
Version: Author's final manuscript
ISSN
0031-9007

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