Noninvasive electron microscopy with interaction-free quantum measurements
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We propose the use of interaction-free quantum measurements with electrons to eliminate sample damage in electron microscopy. This might allow noninvasive molecular-resolution imaging. We show the possibility of such measurements in the presence of experimentally measured quantum decoherence rates and using a scheme based on existing charged particle trapping techniques.
Date issued
2009-10Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer ScienceJournal
Physical Review A
Publisher
American Physical Society
Citation
Putnam, William P., and Mehmet Fatih Yanik. “Noninvasive electron microscopy with interaction-free quantum measurements.” Physical Review A 80.4 (2009): 040902. © 2009 The American Physical Society
Version: Final published version
ISSN
1094-1622
1050-2947