dc.contributor.author | Putnam, William P. | |
dc.contributor.author | Yanik, Mehmet Fatih | |
dc.date.accessioned | 2010-03-04T19:59:42Z | |
dc.date.available | 2010-03-04T19:59:42Z | |
dc.date.issued | 2009-10 | |
dc.date.submitted | 2009-01 | |
dc.identifier.issn | 1094-1622 | |
dc.identifier.issn | 1050-2947 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/52312 | |
dc.description.abstract | We propose the use of interaction-free quantum measurements with electrons to eliminate sample damage in electron microscopy. This might allow noninvasive molecular-resolution imaging. We show the possibility of such measurements in the presence of experimentally measured quantum decoherence rates and using a scheme based on existing charged particle trapping techniques. | en |
dc.description.sponsorship | David and Lucile Packard Foundation | en |
dc.language.iso | en_US | |
dc.publisher | American Physical Society | en |
dc.relation.isversionof | http://dx.doi.org/10.1103/PhysRevA.80.040902 | en |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en |
dc.source | APS | en |
dc.title | Noninvasive electron microscopy with interaction-free quantum measurements | en |
dc.type | Article | en |
dc.identifier.citation | Putnam, William P., and Mehmet Fatih Yanik. “Noninvasive electron microscopy with interaction-free quantum measurements.” Physical Review A 80.4 (2009): 040902. © 2009 The American Physical Society | en |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
dc.contributor.approver | Yanik, Mehmet Fatih | |
dc.contributor.mitauthor | Putnam, William P. | |
dc.contributor.mitauthor | Yanik, Mehmet Fatih | |
dc.relation.journal | Physical Review A | en |
dc.eprint.version | Final published version | en |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en |
dspace.orderedauthors | Putnam, William; Yanik, Mehmet | en |
mit.license | PUBLISHER_POLICY | en |
mit.metadata.status | Complete | |