Show simple item record

dc.contributor.authorPutnam, William P.
dc.contributor.authorYanik, Mehmet Fatih
dc.date.accessioned2010-03-04T19:59:42Z
dc.date.available2010-03-04T19:59:42Z
dc.date.issued2009-10
dc.date.submitted2009-01
dc.identifier.issn1094-1622
dc.identifier.issn1050-2947
dc.identifier.urihttp://hdl.handle.net/1721.1/52312
dc.description.abstractWe propose the use of interaction-free quantum measurements with electrons to eliminate sample damage in electron microscopy. This might allow noninvasive molecular-resolution imaging. We show the possibility of such measurements in the presence of experimentally measured quantum decoherence rates and using a scheme based on existing charged particle trapping techniques.en
dc.description.sponsorshipDavid and Lucile Packard Foundationen
dc.language.isoen_US
dc.publisherAmerican Physical Societyen
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevA.80.040902en
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en
dc.sourceAPSen
dc.titleNoninvasive electron microscopy with interaction-free quantum measurementsen
dc.typeArticleen
dc.identifier.citationPutnam, William P., and Mehmet Fatih Yanik. “Noninvasive electron microscopy with interaction-free quantum measurements.” Physical Review A 80.4 (2009): 040902. © 2009 The American Physical Societyen
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverYanik, Mehmet Fatih
dc.contributor.mitauthorPutnam, William P.
dc.contributor.mitauthorYanik, Mehmet Fatih
dc.relation.journalPhysical Review Aen
dc.eprint.versionFinal published versionen
dc.type.urihttp://purl.org/eprint/type/JournalArticleen
eprint.statushttp://purl.org/eprint/status/PeerRevieweden
dspace.orderedauthorsPutnam, William; Yanik, Mehmeten
mit.licensePUBLISHER_POLICYen
mit.metadata.statusComplete


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record