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An Analytical Technique to Elucidate Field Impurities From Manufacturing Uncertainties of an Double Pancake Type HTS Insert for High Field LTS/HTS NMR Magnets

Author(s)
Iwasa, Yukikazu; Bascunan, Juan; Bobrov, Emanuel Saul; Ahn, Min Cheol; Hahn, Seung-Yong
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Abstract
This paper addresses adverse effects of dimensional uncertainties of an HTS insert assembled with double-pancake coils on spatial field homogeneity. Each DP coil was wound with Bi2223 tapes having dimensional tolerances larger than one order of magnitude of those accepted for LTS wires used in conventional NMR magnets. The paper presents: 1) dimensional variations measured in two LTS/HTS NMR magnets, 350 MHz (LH350) and 700 MHz (LH700), both built and operated at the Francis Bitter Magnet Laboratory; and 2) an analytical technique and its application to elucidate the field impurities measured with the two LTS/HTS magnets. Field impurities computed with the analytical model and those measured with the two LTS/HTS magnets agree quite well, demonstrating that this analytical technique is applicable to design a DP-assembled HTS insert with an improved field homogeneity for a high-field LTS/HTS NMR magnet.
Date issued
2009-07
URI
http://hdl.handle.net/1721.1/52426
Department
Francis Bitter Magnet Laboratory (Massachusetts Institute of Technology)
Journal
IEEE Transactions on Applied Superconductivity
Publisher
Institute of Electrical and Electronics Engineers
Citation
Seung-yong Hahn et al. “An Analytical Technique to Elucidate Field Impurities From Manufacturing Uncertainties of an Double Pancake Type HTS Insert for High Field LTS/HTS NMR Magnets.” Applied Superconductivity, IEEE Transactions on 19.3 (2009): 2281-2284. © 2009 IEEE
Version: Final published version
ISSN
1051-8223

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