| dc.contributor.author | Iwasa, Yukikazu | |
| dc.contributor.author | Bascunan, Juan | |
| dc.contributor.author | Bobrov, Emanuel Saul | |
| dc.contributor.author | Ahn, Min Cheol | |
| dc.contributor.author | Hahn, Seung-Yong | |
| dc.date.accessioned | 2010-03-09T18:50:42Z | |
| dc.date.available | 2010-03-09T18:50:42Z | |
| dc.date.issued | 2009-07 | |
| dc.date.submitted | 2008-08 | |
| dc.identifier.issn | 1051-8223 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/52426 | |
| dc.description.abstract | This paper addresses adverse effects of dimensional uncertainties of an HTS insert assembled with double-pancake coils on spatial field homogeneity. Each DP coil was wound with Bi2223 tapes having dimensional tolerances larger than one order of magnitude of those accepted for LTS wires used in conventional NMR magnets. The paper presents: 1) dimensional variations measured in two LTS/HTS NMR magnets, 350 MHz (LH350) and 700 MHz (LH700), both built and operated at the Francis Bitter Magnet Laboratory; and 2) an analytical technique and its application to elucidate the field impurities measured with the two LTS/HTS magnets. Field impurities computed with the analytical model and those measured with the two LTS/HTS magnets agree quite well, demonstrating that this analytical technique is applicable to design a DP-assembled HTS insert with an improved field homogeneity for a high-field LTS/HTS NMR magnet. | en |
| dc.description.sponsorship | National Institutes of Health, National Center for Research Resources | en |
| dc.language.iso | en_US | |
| dc.publisher | Institute of Electrical and Electronics Engineers | en |
| dc.relation.isversionof | http://dx.doi.org/10.1109/tasc.2009.2018808 | en |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en |
| dc.source | IEEE | en |
| dc.title | An Analytical Technique to Elucidate Field Impurities From Manufacturing Uncertainties of an Double Pancake Type HTS Insert for High Field LTS/HTS NMR Magnets | en |
| dc.type | Article | en |
| dc.identifier.citation | Seung-yong Hahn et al. “An Analytical Technique to Elucidate Field Impurities From Manufacturing Uncertainties of an Double Pancake Type HTS Insert for High Field LTS/HTS NMR Magnets.” Applied Superconductivity, IEEE Transactions on 19.3 (2009): 2281-2284. © 2009 IEEE | en |
| dc.contributor.department | Francis Bitter Magnet Laboratory (Massachusetts Institute of Technology) | en_US |
| dc.contributor.approver | Hahn, Seung-Yong | |
| dc.contributor.mitauthor | Iwasa, Yukikazu | |
| dc.contributor.mitauthor | Bascunan, Juan | |
| dc.contributor.mitauthor | Bobrov, Emanuel Saul | |
| dc.contributor.mitauthor | Ahn, Min Cheol | |
| dc.contributor.mitauthor | Hahn, Seung-Yong | |
| dc.relation.journal | IEEE Transactions on Applied Superconductivity | en |
| dc.eprint.version | Final published version | en |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en |
| dspace.orderedauthors | Seung-yong Hahn; Min Cheol Ahn; Bobrov, E.S.; Bascunan, J.; Iwasa, Y. | en |
| dc.identifier.orcid | https://orcid.org/0000-0001-5712-7350 | |
| mit.license | PUBLISHER_POLICY | en |
| mit.metadata.status | Complete | |