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Breakdown Voltage for Superjunction Power Devices With Charge Imbalance: An Analytical Model Valid for Both Punch Through and Non Punch Through Devices

Author(s)
Wang, Han; Napoli, Ettore; Udrea, Florin
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Abstract
An analytical model for the electric field and the breakdown voltage (BV) of an unbalanced superjunction (SJ) device is presented in this paper. The analytical technique uses a superposition approach treating the asymmetric charge in the pillars as an excess charge component superimposed on a balanced charge component. The proposed double-exponential model is able to accurately predict the electric field and the BV for unbalanced SJ devices in both punch through and non punch through conditions. The model is also reasonably accurate at extremely high levels of charge imbalance when the devices behave similarly to a PiN diode or to a high-conductance layer. The analytical model is compared against numerical simulations of charge unbalanced SJ devices and against experimental results.
Date issued
2009-11
URI
http://hdl.handle.net/1721.1/54726
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Journal
IEEE Transactions on Electron Devices
Publisher
Institute of Electrical and Electronics Engineers
Citation
Han Wang, E. Napoli, and F. Udrea. “Breakdown Voltage for Superjunction Power Devices With Charge Imbalance: An Analytical Model Valid for Both Punch Through and Non Punch Through Devices.” Electron Devices, IEEE Transactions on 56.12 (2009): 3175-3183.© 2009 Institute of Electrical and Electronics Engineers.
Version: Final published version
ISSN
0018-9383
Keywords
superjunction (SJ), semiconductor device modeling, power semiconductor devices, charge imbalance (C.I.), SJ modeling, Analytical model

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