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dc.contributor.authorWang, Han
dc.contributor.authorNapoli, Ettore
dc.contributor.authorUdrea, Florin
dc.date.accessioned2010-05-05T20:51:59Z
dc.date.available2010-05-05T20:51:59Z
dc.date.issued2009-11
dc.date.submitted2009-10
dc.identifier.issn0018-9383
dc.identifier.urihttp://hdl.handle.net/1721.1/54726
dc.description.abstractAn analytical model for the electric field and the breakdown voltage (BV) of an unbalanced superjunction (SJ) device is presented in this paper. The analytical technique uses a superposition approach treating the asymmetric charge in the pillars as an excess charge component superimposed on a balanced charge component. The proposed double-exponential model is able to accurately predict the electric field and the BV for unbalanced SJ devices in both punch through and non punch through conditions. The model is also reasonably accurate at extremely high levels of charge imbalance when the devices behave similarly to a PiN diode or to a high-conductance layer. The analytical model is compared against numerical simulations of charge unbalanced SJ devices and against experimental results.en
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen
dc.relation.isversionofhttp://dx.doi.org/10.1109/ted.2009.2032595en
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en
dc.sourceIEEEen
dc.subjectsuperjunction (SJ)en
dc.subjectsemiconductor device modelingen
dc.subjectpower semiconductor devicesen
dc.subjectcharge imbalance (C.I.)en
dc.subjectSJ modelingen
dc.subjectAnalytical modelen
dc.titleBreakdown Voltage for Superjunction Power Devices With Charge Imbalance: An Analytical Model Valid for Both Punch Through and Non Punch Through Devicesen
dc.typeArticleen
dc.identifier.citationHan Wang, E. Napoli, and F. Udrea. “Breakdown Voltage for Superjunction Power Devices With Charge Imbalance: An Analytical Model Valid for Both Punch Through and Non Punch Through Devices.” Electron Devices, IEEE Transactions on 56.12 (2009): 3175-3183.© 2009 Institute of Electrical and Electronics Engineers.en
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverWang, Han
dc.contributor.mitauthorWang, Han
dc.relation.journalIEEE Transactions on Electron Devicesen
dc.eprint.versionFinal published versionen
dc.type.urihttp://purl.org/eprint/type/JournalArticleen
eprint.statushttp://purl.org/eprint/status/PeerRevieweden
dspace.orderedauthorsWang, Han; Napoli, Ettore; Udrea, Florinen
mit.licensePUBLISHER_POLICYen
mit.metadata.statusComplete


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