| dc.contributor.author | Yamauchi, Toyohiko | |
| dc.contributor.author | Sugiyama, Norikazu | |
| dc.contributor.author | Sakurai, Takashi | |
| dc.contributor.author | Iwai, Hidenao | |
| dc.contributor.author | Yamashita, Yutaka | |
| dc.date.accessioned | 2010-09-16T20:56:53Z | |
| dc.date.available | 2010-09-16T20:56:53Z | |
| dc.date.issued | 2010-02 | |
| dc.date.submitted | 2010-01 | |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/58576 | |
| dc.description.abstract | Cell membrane motions of living cells are quantitatively measured in nanometer resolution by low-coherent full-field quantitative phase microscopy. Our setup is based on a full-field phase shifting interference microscope with a very lowcoherent light source. The reflection mode configuration and the low-coherent illumination make it possible to differentiate the weak reflection light from the cell membrane from the strong reflection from the glass substrate. Two cell populations are quantitatively assessed by the power spectral density of the cell surface motion and show different trends. | en_US |
| dc.language.iso | en_US | |
| dc.publisher | SPIE | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1117/12.841008 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | SPIE | en_US |
| dc.title | Label-free classification of cell types by imaging of cell membrane fluctuations using low-coherent full-field quantitative phase microscopy | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Yamauchi, Toyohiko et al. “Label-free classification of cell types by imaging of cell membrane fluctuations using low-coherent full-field quantitative phase microscopy.” Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII. Ed. Jose-Angel Conchello et al. San Francisco, California, USA: SPIE, 2010. 75700X-8. ©2010 SPIE. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Spectroscopy Laboratory | en_US |
| dc.contributor.approver | Yamauchi, Toyohiko | |
| dc.contributor.mitauthor | Yamauchi, Toyohiko | |
| dc.relation.journal | Proceedings of SPIE--the International Society for Optical Engineering ; v. 7570 | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Yamauchi, Toyohiko; Sugiyama, Norikazu; Sakurai, Takashi; Iwai, Hidenao; Yamashita, Yutaka | en |
| mit.license | PUBLISHER_POLICY | en_US |
| mit.metadata.status | Complete | |