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dc.contributor.authorYamauchi, Toyohiko
dc.contributor.authorSugiyama, Norikazu
dc.contributor.authorSakurai, Takashi
dc.contributor.authorIwai, Hidenao
dc.contributor.authorYamashita, Yutaka
dc.date.accessioned2010-09-16T20:56:53Z
dc.date.available2010-09-16T20:56:53Z
dc.date.issued2010-02
dc.date.submitted2010-01
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/1721.1/58576
dc.description.abstractCell membrane motions of living cells are quantitatively measured in nanometer resolution by low-coherent full-field quantitative phase microscopy. Our setup is based on a full-field phase shifting interference microscope with a very lowcoherent light source. The reflection mode configuration and the low-coherent illumination make it possible to differentiate the weak reflection light from the cell membrane from the strong reflection from the glass substrate. Two cell populations are quantitatively assessed by the power spectral density of the cell surface motion and show different trends.en_US
dc.language.isoen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.841008en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSPIEen_US
dc.titleLabel-free classification of cell types by imaging of cell membrane fluctuations using low-coherent full-field quantitative phase microscopyen_US
dc.typeArticleen_US
dc.identifier.citationYamauchi, Toyohiko et al. “Label-free classification of cell types by imaging of cell membrane fluctuations using low-coherent full-field quantitative phase microscopy.” Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII. Ed. Jose-Angel Conchello et al. San Francisco, California, USA: SPIE, 2010. 75700X-8. ©2010 SPIE.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Spectroscopy Laboratoryen_US
dc.contributor.approverYamauchi, Toyohiko
dc.contributor.mitauthorYamauchi, Toyohiko
dc.relation.journalProceedings of SPIE--the International Society for Optical Engineering ; v. 7570en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsYamauchi, Toyohiko; Sugiyama, Norikazu; Sakurai, Takashi; Iwai, Hidenao; Yamashita, Yutakaen
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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