Frequency domain multiplexing of force signals with application to magnetic resonance force microscopy

Author(s)
Degen, Christian; Poggio, M.; Oosterkamp, T. H.; Mamin, H. J.; Rugar, D.
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Abstract
Frequency domain multiplexing, using an actively damped micromechanical cantilever, is used to detect multiple force signals simultaneously. The measurement principle is applied to magnetic resonance force microscopy to allow concurrent measurement of nuclear spin signals originating from distinct regions of the sample, or from multiple spin species.
Date issued
2010-02
URI
http://hdl.handle.net/1721.1/59335
Department
Massachusetts Institute of Technology. Department of Chemistry
Journal
Applied Physical Letters
Publisher
American Institute of Physics
Citation
Oosterkamp, T. H. et al. “Frequency domain multiplexing of force signals with application to magnetic resonance force microscopy.” Applied Physics Letters 96.8 (2010): 083107-3. ©2010 American Institute of Physics.
Version: Final published version
ISSN
0003-6951
1077-3118
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