| dc.contributor.author | Degen, Christian | |
| dc.contributor.author | Poggio, M. | |
| dc.contributor.author | Oosterkamp, T. H. | |
| dc.contributor.author | Mamin, H. J. | |
| dc.contributor.author | Rugar, D. | |
| dc.date.accessioned | 2010-10-14T19:01:38Z | |
| dc.date.available | 2010-10-14T19:01:38Z | |
| dc.date.issued | 2010-02 | |
| dc.date.submitted | 2009-10 | |
| dc.identifier.issn | 0003-6951 | |
| dc.identifier.issn | 1077-3118 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/59335 | |
| dc.description.abstract | Frequency domain multiplexing, using an actively damped micromechanical cantilever, is used to detect multiple force signals simultaneously. The measurement principle is applied to magnetic resonance force microscopy to allow concurrent measurement of nuclear spin signals originating from distinct regions of the sample, or from multiple spin species. | en_US |
| dc.description.sponsorship | European Research Council | en_US |
| dc.description.sponsorship | National Science Foundation (U.S.) | en_US |
| dc.description.sponsorship | Stanford University. Center for Probing the Nanoscale (Grant No. NSF PHY-0425897) | en_US |
| dc.language.iso | en_US | |
| dc.publisher | American Institute of Physics | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1063/1.3304788 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | MIT web domain | en_US |
| dc.title | Frequency domain multiplexing of force signals with application to magnetic resonance force microscopy | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Oosterkamp, T. H. et al. “Frequency domain multiplexing of force signals with application to magnetic resonance force microscopy.” Applied Physics Letters 96.8 (2010): 083107-3. ©2010 American Institute of Physics. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Chemistry | en_US |
| dc.contributor.approver | Degen, Christian | |
| dc.contributor.mitauthor | Degen, Christian | |
| dc.relation.journal | Applied Physical Letters | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Oosterkamp, T. H.; Poggio, M.; Degen, C. L.; Mamin, H. J.; Rugar, D. | en |
| mit.license | PUBLISHER_POLICY | en_US |
| mit.metadata.status | Complete | |
