Blackbox polynomial identity testing for depth 3 circuits
Author(s)Kayal, Neeraj; Saraf, Shubhangi
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We study EIIE(k) circuits, i.e., depth three arithmetic circuits with top fanin k. We give the first deterministic polynomial time blackbox identity test for EIIE(k) circuits over the field Q of rational numbers, thus resolving a question posed by Klivans and Spielman (STOC 2001).
DepartmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory; Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
50th Annual IEEE Symposium on Foundations of Computer Science, 2009. FOCS '09
Institute of Electrical and Electronics Engineers
Kayal, N., and S. Saraf. “Blackbox Polynomial Identity Testing for Depth 3 Circuits.” Foundations of Computer Science, 2009. FOCS '09. 50th Annual IEEE Symposium on. 2009. 198-207. © 2009 Institute of Electrical and Electronics Engineers.
Final published version
INSPEC Accession Number: 11207145
Arithmetic circuits, Derandomization, Sylvester–Gallai Theorem