Blackbox polynomial identity testing for depth 3 circuits
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We study EIIE(k) circuits, i.e., depth three arithmetic
circuits with top fanin k. We give the first deterministic polynomial
time blackbox identity test for EIIE(k) circuits over the field Q of
rational numbers, thus resolving a question posed by Klivans and
Spielman (STOC 2001).
Date issued
2010-03Department
Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory; Massachusetts Institute of Technology. Department of Electrical Engineering and Computer ScienceJournal
50th Annual IEEE Symposium on Foundations of Computer Science, 2009. FOCS '09
Publisher
Institute of Electrical and Electronics Engineers
Citation
Kayal, N., and S. Saraf. “Blackbox Polynomial Identity Testing for Depth 3 Circuits.” Foundations of Computer Science, 2009. FOCS '09. 50th Annual IEEE Symposium on. 2009. 198-207. © 2009 Institute of Electrical and Electronics Engineers.
Version: Final published version
Other identifiers
INSPEC Accession Number: 11207145
ISBN
978-1-4244-5116-6
ISSN
0272-5428
Keywords
Arithmetic circuits, Derandomization, Sylvester–Gallai Theorem