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dc.contributor.authorKayal, Neeraj
dc.contributor.authorSaraf, Shubhangi
dc.date.accessioned2010-10-20T20:25:16Z
dc.date.available2010-10-20T20:25:16Z
dc.date.issued2010-03
dc.date.submitted2009-10
dc.identifier.isbn978-1-4244-5116-6
dc.identifier.issn0272-5428
dc.identifier.otherINSPEC Accession Number: 11207145
dc.identifier.urihttp://hdl.handle.net/1721.1/59436
dc.description.abstractWe study EIIE(k) circuits, i.e., depth three arithmetic circuits with top fanin k. We give the first deterministic polynomial time blackbox identity test for EIIE(k) circuits over the field Q of rational numbers, thus resolving a question posed by Klivans and Spielman (STOC 2001).en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Award CCF 0829672)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/FOCS.2009.67en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.subjectArithmetic circuitsen_US
dc.subjectDerandomizationen_US
dc.subjectSylvester–Gallai Theoremen_US
dc.titleBlackbox polynomial identity testing for depth 3 circuitsen_US
dc.typeArticleen_US
dc.identifier.citationKayal, N., and S. Saraf. “Blackbox Polynomial Identity Testing for Depth 3 Circuits.” Foundations of Computer Science, 2009. FOCS '09. 50th Annual IEEE Symposium on. 2009. 198-207. © 2009 Institute of Electrical and Electronics Engineers.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverSaraf, Shubhangi
dc.contributor.mitauthorSaraf, Shubhangi
dc.relation.journal50th Annual IEEE Symposium on Foundations of Computer Science, 2009. FOCS '09en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsKayal, Neeraj; Saraf, Shubhangien
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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