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dc.contributor.authorPinto, Nicolas
dc.contributor.authorDiCarlo, James
dc.contributor.authorCox, David D.
dc.date.accessioned2010-11-12T19:32:00Z
dc.date.available2010-11-12T19:32:00Z
dc.date.issued2009-06
dc.identifier.urihttp://hdl.handle.net/1721.1/59976
dc.description.abstractIn recent years, large databases of natural images have become increasingly popular in the evaluation of face and object recognition algorithms. However, Pinto et al. previously illustrated an inherent danger in using such sets, showing that an extremely basic recognition system, built on a trivial feature set, was able to take advantage of low-level regularities in popular object and face recognition sets, performing on par with many state-of-the-art systems. Recently, several groups have raised the performance "bar" for these sets, using more advanced classification tools. However, it is difficult to know whether these improvements are due to progress towards solving the core computational problem, or are due to further improvements in the exploitation of low-level regularities. Here, we show that even modest optimization of the simple model introduced by Pinto et al. using modern multiple kernel learning (MKL) techniques once again yields "state-of-the-art" performance levels on a standard face recognition set ("labeled faces in the wild"). However, at the same time, even with the inclusion of MKL techniques, systems based on these simple features still fail on a synthetic face recognition test that includes more "realistic" view variation by design. These results underscore the importance of building test sets focussed on capturing the central computational challenges of real-world face recognition.en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (NEI R01EY014970)en_US
dc.description.sponsorshipMcKnight Endowment Fund for Neuroscienceen_US
dc.description.sponsorshipDr. Gerald Burnett and Marjorie Burnetten_US
dc.description.sponsorshipRowland Institute at Harvarden_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/CVPRW.2009.5206605en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleHow far can you get with a modern face recognition test set using only simple features?en_US
dc.typeArticleen_US
dc.identifier.citationPinto, N., J.J. DiCarlo, and D.D. Cox. “How far can you get with a modern face recognition test set using only simple features?.” Computer Vision and Pattern Recognition, 2009. CVPR 2009. IEEE Conference on. 2009. 2591-2598. © 2009, IEEEen_US
dc.contributor.departmentMcGovern Institute for Brain Research at MIT
dc.contributor.approverDiCarlo, James
dc.contributor.mitauthorPinto, Nicolas
dc.contributor.mitauthorDiCarlo, James
dc.relation.journalIEEE Conference on Computer vision and Pettern Recognitionen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsPinto, N.; DiCarlo, J.J.; Cox, D.D.en
dc.identifier.orcidhttps://orcid.org/0000-0002-1592-5896
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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